ZEISS Axio Imager 2 - 23 Pages

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ZEISS Axio Imager 2

Catalog excerpts

Product Information Version 1.1 ZEISS Axio Imager 2 Your Open Microscope System for Automated Material Analysis

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Your Open Microscope System for Automated Material Analysis Axio Imager 2 from ZEISS is your system platform tailored to demanding materials analysis tasks, development of new materials as well as quality control. You always profit from crisp images and high optical performance. This applies in particular to sophisticated contrasting techniques, e.g. like the Circular Differential Interference Contrast (C-DIC) and polarization contrast. Use the motorized stand to achieve reproducible illumination settings and, consequently, constant image quality. You always obtain comparable results and...

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Simpler. More Intelligent. More Integrated. Profit from an Open Microscope System Achieve Reliable, Reproducible Results Experience Competence in all Contrasting Techniques Whether in research, testing or failure analysis, Choose from a variety of contrasting techniques Stability is essential if you want to obtain good materials microscopy faces quite various to achieve an optimum image quality for your results. You will appreciate the stable imaging challenges. With Axio Imager 2 from ZEISS you dedicated applications. Examine your samples in conditions of Axio Imager 2, especially when...

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Expand Your Possibilities Experience Competence in all Contrasting Techniques Brightfield and Darkfield: Maximum Homogeneity and a Stray Light Free Image Background In brightfield Axio Imager 2 provides homogeneous illumination and exceptional contrast. By minimizing disturbing stray light and reducing the longitudinal color aberration of the illumination optics, the darkfield illumination contrast is suitable for the most challenging samples and impresses even when faced with finest structures. Switching between the techniques only requires a simple 100 µm Copper casting, brightfield....

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Expand Your Possibilities Experience Competence in All Contrasting Techniques > The Applications > The System > Technology and Details > Service 200 Mm Polarization Contrast Polarization with Additional Lambda Plate Contrasting    Reflected    Transmitted Technique    Light    Light Brightfield    •    • Darkfield    •    • Polarization    •    • Sample: pure aluminum; Objective: EC Epiplan-NEOFLUAR 10x10.25, same position acquired with different contrasting techniques

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Tailored Precisely to Your Applications Industry, Typical Applications, Typical Samples ZEISS Axio Imager 2 Offers Automotive Industry Quality control and development of compound materials Quality control of welded joints Examination of inclusions and cracks Determination of grain sizes and non-metallic inclusions Particle Analysis Hardware Auto Focus Correlative microscopy and AxioVision module Shuttle & Find Polarization contrast and C-DIC AxioVision modules: Grains, Graphite, NMI, Multiphase AxioVision module: Particle Analyzer Aviation and Space Industry Quality control and development...

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> The Advantages > The Applications > The System Industry, Typical Applications, Typical Samples    Task    ZEISS Axio Imager 2 Offers Non-metallic Inclusions (NMI)    Quantitative and qualitative analysis of microstructure of steel    AxioVision module NMI Determination of purity of steel Investigation of content and distribution of non-metallic inclusions based on color, brightness, shape and formation Evaluation of inclusions with comparative diagrams Precise identification of sulfides and oxides acc. to DIN 50602, EN 10247, ASTM E45, ISO 4967 and JIS G 0555 > Technology and Details...

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ZEISS Axio Imager 2 at Work Aviation and Space Industry › Service 20 µm Carbon fiber-reinforced polymer (CFRP), brightfield, objective: EC Epiplan-NEOFLUAR 50×/0.8 20 µm Carbon fiber-reinforced polymer (CFRP), darkfield, objective: EC Epiplan-NEOFLUAR 50×/0.8 20 µm Carbon fiber-reinforced polymer (CFRP), DIC, objective: EC Epiplan-NEOFLUAR 50×/0.8 Metal Producing and Processing Industry 20 µm Raw iron, brightfield, objective: EC Epiplan-NEOFLUAR 50×/0.8 200 µm Aluminium, polarization, objective: EC Epiplan-NEOFLUAR 10×/0.25 200 µm Aluminium, polarization with Lambda plate, objective: EC...

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ZEISS Axio Imager 2 at Work Particle Analysis Automotive Industry › Service 10 µm Vitrinite, objective: EC Epiplan-NEOFLUAR 50×/1.0 Oil Pol 20 µm Cast iron, brightfield, objective: EC Epiplan-APOCHROMAT 50×/0.95 50 µm Particle analysis, brightfield, objective: EC Epiplan-NEOFL

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Expand Your Possibilities Analyze Tiny Particles: Accurately and Reproducibly Particle Analyzer is a milestone for your quality control. With the fully motorized light microscope Axio Imager 2 you measure particles down to 2 µm. Particle Analyzer software supports the standards for cleanliness testing ISO 16232, VDA 19, and oil analysis ISO 4406, ISO 4407, and SAE AS 4059. With the system solutions from ZEISS, you ensure that the required microscope settings are always selected correctly. You receive reliable, reproducible results nearly independent of the user carrying out the analysis. By...

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Expand Your Possibilities Correlative Automated Particle Analysis (CAPA): More Knowledge. Higher Quality. Completely characterize residual dirt particles with As an experienced user, you can inspect the results Correlative Automated Particle Analysis from of the combined light microscopic and electron ZEISS. Detect particles with your Axio Imager 2 microscopic analysis on an interactive overview and relocate preselected particles automatically, screen. Retrieve particles at the touch of a button, using your SEM from ZEISS. Perform an EDX automatically start new EDX analyzes, and auto-...

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