カタログの抜粋
High-Content Microscopy DELIVERING: FLEXIBILITY Combine high-speed peripheral device choices for an integrated high-content imaging system with optional automated plate delivery, fast autofocusing, wavelength switching, and an interchangeable camera. Configuration of experimental job runs is streamlined with easy-to-use setup tools. The integrated database offers centralized organization and display of acquired images, sample labeling, binary overlays, heat maps and filtering for seamless data review and export. Custom and built-in analysis routines available for multiplexing during and post acquisition. HIGH-CONTENT IMAGING FOR YOUR DEVELOPING PROJECTS Nikon’s comprehensive High-Content Imaging System merges the entire functionality of the Ti + Perfect Focus microscope that researchers are accustomed to with interchangeable choices for high-speed piezo-based autofocusing, plate handling, various light sources, fast wavelength switching, and the full range of camera model support. In addition, magnification and fluorescence filters are exchangeable, extending imaging possibilities and experimental assay design options. The new high-content-microscope-based system delivers the option for researchers to facilitate their experimental protocols by coupling the industry-leading Ti-E microscope, high-speed camera and peripheral device choices with the power of NIS-Elements HC software capabilities. This synergy and Nikon’s imaging expertise provide a new avenue for addressing high-content imaging challenges. Powered by High Content Analysis
カタログの1ページ目を開くHigh Content imaging system enhances efficiency of your experimental workflow Plate Definition Sample Definition Sample Labeling Sample labeling Acquired images Data Output ■ Specifications High Content Analysis System Motorized inverted microscope ECLIPSE Ti-E Compatible well plate types Center, Covering, Random, Random +Center and Regular pattern in each well Illumination methods Fluorescence, Phase contrast, DIC Image acquisition Multichannel, Time lapse, Multidimensional imaging Acquisition speed 2 min/96 well plate (1 point/well, 30 msec/shot, without Z stacking, PFS (Perfect Focus...
カタログの2ページ目を開くNikon Instrumentsのすべてのカタログと技術パンフレット
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TI-E
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