FT-IR SPECTROMETER

FT-IR SPECTROMETER MODEL NO.- ACM-FT-IRS FEATURES Ÿ Unique cube-corner Michelson interferometer features not only small size and compact structure but also higher stability and less sensitive to vibrations and thermal variations compared with conventional Michelson interferometer. Ÿ Outside IR source design with easy replacement provides higher thermal stability. Stable interference is obtained without the need of dynamic adjustment. Ÿ High intensity IR source adopts a reflex sphere to obtain even and stable IR radiation HIGH ACCURACY AND RELIABILITY Ÿ The application of programmable gain amplifier,...

analyzing, and spectrum output function etc. can be performed Ÿ The spectrometer connects to PC via a USB port for automatic control and data communication, fully realizing plug- and-play and raising the software flexibility Ÿ An optional external beam allows access to the widest variety of high sensitive peripheral sampling system, such as GC/IR interface and FTIR microscope. Ÿ Various special IR libraries are available for routine search. Users can also add and maintain the libraries or set up VARIOUS ACCESSORIES Ÿ The sampling compartment is wide enough for various accessories such as diffused/specular...

IR MICROSCOPE Ÿ Micro samples analysis, minimum sample size: 100µm (DTGS detector) and 20µm (MCT detector) Ÿ Non-destructive sample analysis Ÿ Translucent sample analysis Ÿ Two measurement methods: transmission and reflection Ÿ Easy sample preparation DIFFUSE/SPECULAR REFLECTANCE ACCESSORY Ÿ It is a versatile diffuse reflectance and specular reflectance accessory. Diffuse reflection mode is used for transparent and powder sample analysis. Specular reflection mode is for measuring smooth reflective surface and coating surface. Ÿ High light throughput Ÿ Easy operation, no internal adjustment needed...

Ÿ Easy installation and operation Ÿ High light throughput Ÿ Variable depth of IR penetration ACCESSORY FOR DETERMINATION OF HYDROXYL IN IR QUARTZ Ÿ Fast, convenient and accurate measurement of Hydroxyl content in IR quartz Ÿ Direct measurement to IR quartz tube, no need to cut samples Ÿ Accuracy: =1×10-6 (=1ppm) ACCESSORY FOR OXYGEN AND CARBON IN SILICON CRYSTAL DETERMINATION Ÿ Special silicon plate holder Ÿ Automatic, fast and accurate measurement of oxygen and carbon in silicon crystal Ÿ Lower detection limit: 1.0×10-6cm-3 (at room temperature) Ÿ Silicon plate thickness:0.1-3.5nm SIO2 POWDER...

COMPONENT TESTING ACCESSORY Ÿ Fast accurate measurement of the response of such components as MCT, InSb and PbS etc. Ÿ Curve, peak wavelength, stop wavelength and D* etc can be presented OPTIC FIBER TESTING ACCESSORY Ÿ Easy and accurate measurement of the loss rate of IR optic fiber, overcoming the difficulties for fiber testing , since they are very thin, with very small light-passing holes and uneasy to fix. SPECIFICATIONS Spectral Range Better than 0.85cm-1 (WQF510), Better than 0.5cm-1 (WQF520) Wavenumber Precision Scanning Speed 0.2-2.5 cm-1/s, automatically optimized for detector type or...

Infrared Source External, air-cooled, high efficiency Reflex Sphere module Date System Compatible computer FT-IR software contains all routines needed for basic spectrometer of operations

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