Bigeye G-132 NIR Cool
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Catalog excerpts

Bigeye G-132 NIR Cool - 1

Vision Bigeye G G-132 NIR Cool • Sensitive in both the visible and NIR spectrum • Exposure time up to more than 4200 s Description NIR optimized camera with Sony ICX285, Peltier cooling -20 °C The Bigeye G-132B NIR Cool is distinguished by high performance both in the visible spectrum and the NIR spectrum; its Sony ICX285 CCD sensor is modified for enhanced NIR sensitivity. Benefits and features: • GigE Vision, multi-functional, user-configurable I/O interface • Sony ICX285 EXview HAD CCD sensor, 1280 x 1024 pixels, extended sensitivity ranging from 350 nm to 1000 nm, peltier cooling, stabilized to -20 °C, exposure time up to 4292 s (» 71 min) • Reliable operation under rough industrial conditions Specifications Bigeye G Interface Resolution Sensor Sensor type Sensor size Pixel size Cooling temperature Temporal dark noise Dark current Saturation capacity Dynamic range G-132 NIR Cool IEEE 802.3 1000baseT 1280 (H) x 1024 (V) Sony ICX285 CCD Progressive Type 2/3 6.45 pm x 6.45 pm -20 °C tdb tbd tbd tbd

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Bigeye G-132 NIR Cool - 2

Allied Vision Bigeye G Gain (6 dB) Exposure time 80077 ps to 4294 seconds (~ 71 min)

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Bigeye G-132 NIR Cool - 3

Vision • Binning (2x1, 2x2) • Three look-up tables (LUTs) • Gamma (0.45, 0.5, 0.7) • Five storable user sets Easy integration The Bigeye G-132 NIR Cool can be easily integrated into your application, since it is GigE Vision compliant and compatible with Allied Vision's GigE SDKs. Additionally, this camera can be used with numerous third-party software solutions.

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Bigeye G-132 NIR Cool - 4

Vision Applications The Bigeye G-132B NIR Cool is a prime quality CCD camera that is sensitive both in the visible and the NIR spectrum. It is optimal for applications requiring long exposure times. Typical applications: • Low-noise imaging (industrial and scientific imaging) • Image acquisition with long exposure times • Microscopy with high resolution • Fluorescence microscopy • Gel electrophoresis, DNA documentation • Non-destructive evaluation of photosensitive objects • Astronomy • Solar cell/wafer inspection

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