attoAFM I

attoAFM I

attoAFM I

Product catalog summary
General Specifications
The attoAFM I is a cantilever-based Atomic Force Microscope (AFM) featuring an interferometric deflection detection system. It includes an alignment-free cantilever holder compatible with PointProbe® Plus XY-Alignment Series by Nanosensors, allowing for tip exchange in under two minutes. An optional conventional cantilever holder is available for standard commercial cantilevers.

Modes of Operation
The instrument supports various imaging modes including contact mode, non-contact mode, constant height, and constant force. It features a two-axis scan plane correction for slope compensation and a PI feedback loop for amplitude, phase, or frequency modulation using an included PLL. Optional upgrades include MFM, KPFM, PFM, and conductive-tip AFM.

Resolution
The AFM offers a measured RMS z-noise of less than 0.10 nm at 4 K with a 5 ms pixel time, and a guaranteed noise level of less than 0.15 nm. The z deflection noise density is under 3 pm/vHz, and the lateral magnetic resolution is less than 50 nm. The z bit resolution at 4 K is 57 pm at a 15 µm scan range.

Sample Positioning
The total travel range is 5 x 5 x 4.8 mm³ in open loop, with a step size ranging from 0.05 to 3 µm at 300 K and 10 to 500 nm at 4 K. The fine scan range is 50 x 50 x 24 µm³ at 300 K and 30 x 30 x 15 µm³ at 4 K. A closed loop scanning option is available.

Suitable Operating Conditions
The AFM operates within a temperature range of 1.8 K to 300 K, depending on the cryostat, and is compatible with magnetic fields up to 15 T+. It is designed for He exchange gas, with a vacuum-compatible version available upon request.

Suitable Cooling Systems
The titanium housing has a diameter of 48 mm and is designed for a 2" (50.8 mm) cryostat/magnet bore. Compatible cryostats include the attoDRY2200 and attoDRY1000.

Compatibility with Electronics
The AFM is compatible with the ASC500 and Nanonis Mimea scan controllers and software. It uses the LDM1300 laser/detector module.

Options and Upgrades
Available upgrades include closed loop scanning with interferometric encoders, an ultra-large scan range upgrade, in-situ inspection optics, and a closed loop upgrade for coarse positioners. An additional AFM head with manual alignment is also available.

All rights reserved by attocube systems AG. Delivery is subject to availability, and designations may be trademarks.
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Catalog excerpts

attoAFM I-1

attoAFM I 1012528 Technical Specifications General Specifications type of instrument sensor head specifics alignment-free cantilever holder (default) conventional cantilever holder (optional) Modes of Operation imaging modes slope compensation z feedback incl. standard techniques optional upgrades Resolution measured RMS z-noise (constant force @ 4 K, 5 ms pixel time) z deflection noise density lateral magnetic resolution z bit resolution @ 4 K Sample Positioning total travel range step size fine scan range closed loop scanning sample holder Suitable Operating Conditions temperature range magnetic field range operating pressure Suitable Cooling Systems titanium housing diameter bore size requirement compatible cryostats Compatibility with Electronics scan controller and software laser Options and Upgrades closed loop scanning & global sample coordinates ultra-large scan range upgrade in-situ inspection optics closed loop upgrade for coarse positioners additional AFM head with manual alignment cantilever based AFM with interferometric deflection detection attoAFM I+ head feat. alignment-free cantilever holder, tip exchange in less than 2 minutes compatible with PointProbe® Plus XY-Alignment Series by Nanosensors compatible with standard commercial cantilevers contact mode, non-contact mode, constant height, constant force 2 axis scan plane correction PI feedback loop for amplitude modulation (AM), phase modulation (PM) or frequency modulation (FM) using included PLL, constant force AFM MFM, KPFM, PFM, conductive-tip AFM < 0.10 nm (expected for attoDRY), < 0.15 nm (guaranteed) < 3 pm/vHz (dependent on laser system) < 50 nm (attoDRY) 57 pm at 15 µm scan range 5 x 5 x 4.8 mm³ (open loop) 0.05..3 µm @ 300 K, 10..500 nm @ 4 K 50 x 50 x 24 µm³ @ 300 K, 30 x 30 x 15 µm³ @ 4 K (open loop) optional ASH/QE/4CX quick-exchange sample holder with 8 electrical contacts, integrated heater with calibrated temperature sensor 1.8 K .. 300 K (dependent on cryostat); mK compatible setup available on request 0..15 T+ (dependent on magnet) designed for He exchange gas (vacuum compatible version down to 1E-6 mbar on request) 48 mm designed for a 2" (50.8 mm) cryostat/magnet bore attoDRY2200, attoDRY1000 ASC500, Nanonis Mimea LDM1300 laser/detector module (for detailed specifications please see attoCONTROL section) interferometric encoders for scan linearization and closed loop sample navigation 80 x 80 µm² @ 300 K, 125 x 125 µm² @ 4 K tip/sample monitoring via in-situ LT-LED for illumination, mirrors, lenses and CCD camera (outside), field of view approx. 3 x 2 mm, resolution approx. 20 µm (depending on cryostat) resistive encoder, range 5 mm, sensor resolution approx. 200 nm, repeatability 1-2 µm conventional cantilever holder, compatible with standard commercial cantilevers All rights, including rights created by patent grant or registration of a utility model or design as well as rights of technical modifications are reserved. Delivery subject to availability. Designations may be trademarks, the use of which by third parties for their own purposes may violate the rights of the trademark owners. © attocub

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attoAFM I-2

All rights, including rights created by patent grant or registration of a utility model or design as well as rights of technical modifications are reserved. Delivery subject to availability. Designations may be trademarks, the use of which by third parties for their own purposes may violate the rights of the trademark owners. © attocube systems AG

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