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39-40 Atomic Force Microscopy BK-AFM1000
1 /1Page

39-40 Atomic Force Microscopy BK-AFM1000

39-40 Atomic Force Microscopy BK-AFM1000
1 /1Page

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39-40 Atomic Force Microscopy BK-AFM1000-1

BIOBASG BIOBASE CHINA * Integrated scanning-probe and sample-stage enhances the anti-interference ability of the spring suspension system. * Precision laser and probe positioning device makes probe changing and spot adjusting simple and convenient. * The sample-to-probe auto-approaching provides an efficient way to prevent cantilever crash. * The vertical sample probe approaching allows achieving precise positioning of area of interest. * Sample scanning area of interest may be freely selected with an high-precision/wide-range XY table. * Top-view CCD system warrants real-time observation and positioning of the probe on the selected sample region. * Modular design of electronic control system facilitates maintenance and continuous improvements. * The compact model 2000 may be easily transported inside an aluminum luggage. * The hermetic box in model 1000 provides a controlled environment.

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