Dimension Edge with ScanAsyst Most Accessible High-Performance AFM Innovation with Integrity Atomic Force Microscopy

Dimension Edge with ScanAsyst The Dimension Edge™ Atomic Force Microscope (AFM) incorporates Bruker’s PeakForce Tapping™ technology to provide the highest levels of performance, functionality, and accessibility in its class. Based on the Dimension Icon® platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. ScanAsyst® imaging, integrated visual feedback, and preconfigured settings enable expert-level results simply...

Streamlined Access to Top AFM Performance Expert AFM Made Easy Dimension Edge utilizes ScanAsyst, the world’s first automatic image optimization technology for atomic force microscopy. This patent-pending innovation uses intelligent algorithms to automatically and continuously monitor image quality and make the appropriate parameter adjustments. This frees researchers from the complex and tedious task of adjusting setpoints, feedback gains, and scan rates, making imaging as easy as simply selecting a scan area and scan size for almost any sample, in air or fluid. ScanAsyst is based on Bruker’s...

New Standard in Time to Publication-Ready Data With more published research results than any other largesample AFM, the Dimension® AFM platform is widely recognized as the industry leader in productivity. With ScanAsyst, streamlined software workflow, and userfriendly design, Dimension Edge raises the bar yet again. The software ensures the most efficient setup in both basic and advanced modes, while providing integrated real-time control of the motorized stage and high-resolution optics, including programmed stage movement for automated, multisite measurements. The hardware combines high performance...

Effective Solutions for Advanced Applications Electrical Characterization Utilizing Dark Lift, Dimension Edge goes beyond merely connecting an AFM probe to a low-noise current amplifier. Dark Lift is the only means to distinguish unambiguously intrinsic sample conductivity from photoelectric effects in conductive AFM data. It is based upon Bruker’s patented LiftMode™, which has become well known for its capabilities in magnetic and electric force microscopy. The system draws upon both of these to ensure the optimized approach for any electrostatic potential mapping application. Combining Dark...

Easy Access and Control The large sample stage of the Dimension Edge is not only motorized and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time. The physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as the attachment of electrical connections or other custom experiment accessories. The same streamlined functionality is found in the controller, which provides costeffective but powerful customization...

Exceptional Productivity for Research & Industry Productive, easy-to-use interface. High-performance AFM is able to investigate the nanometer-scaled organization of the component biopolymers of wheat grain, leading to improved understanding of their relationship to the macroscopic properties of the resulting cereal products. Image size 90µm. With its focus on streamlined access to a new performance level, the Dimension Edge AFM with ScanAsyst represents a new standard of productivity and attainability for the most advanced nanoscale research. Just place a sample on the stage to discover new information...

Dimension Edge Specifications 90μm x 90μm typical, 85μm minimum 10μm typical in imaging and force ramp modes, 9.5μm minimum Vertical Noise Floor <50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz) XY Position Sensor Noise Level (Closed Loop) <0.5nm RMS typical imaging bandwidth (up to 625Hz) Z Position Sensor Noise Level (Closed Loop) <0.2nm RMS typical imaging bandwidth (up to 625Hz) 150mm vacuum chuck, 15mm thick; Up to 40mm thick with optional frame spacer Motorized Positioning Stage (X-Y axis) 150mm x 150mm inspectable area; Programmable for multi-site measurements...