Dimension FastScan The World’s Fastest AFM Innovation with Integrity Atomic Force Microscopy

The New Benchmark for Speed... with Highest Resolution and Performance The Dimension FastScan Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without sacrificing legendary Dimension© Icon© resolution and performance. This breakthrough innovation enables radically faster time to publishable data for all levels of AFM expertise. TM Stimulated by AFM users’ need for greater AFM efficiency, Bruker set out to develop a system that could scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. Now, with the Dimension...

Dimension FastScan Dimension FastScan The Benchmark for AFM Speed Dimension FastScan is the first AFM to achieve the perfect balance of scan-speed, resolution, accuracy, drift, and noise, making fast scanning atomic force microscopy a commercial reality. To deliver the new gold standard in AFM technology, Bruker engineers n Used the lowest drift tip-scanning AFM platform technology and increased its fundamental resonant frequency, n Implemented a new generation NanoScope® controller with proven high-bandwidth electronics, n Developed a process for a consistent supply of small cantilevers, with...

Dimension FastScan AFM System Bruker’s Dimension FastScan is a technological innovation built upon one of the world’s most utilized AFM platforms. The FastScan system delivers high-bandwidth in conjunction with an ultra-stable, low-noise platform to provide the most productive AFM available. Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, this system will expand your laboratory’s capabilities beyond that of any other single instrument you can purchase. Dimension FastScan System Configuration FastScan Scanner FastScan...

Ultimate Performance The Dimension FastScan’s superior scan speed, high-bandwidth electronics, and Broadband family of cantilevers provide the user a new experience in AFM by providing a choice of where to apply the bandwidth capacity. High scan rate or ultimate resolution while maintaining exceptional tip force control is a leap into a new generation of AFM use. The FastScan AFM system is the latest evolution of our industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors in its two scanners to render noise levels in the sub-angstrom range for the...

Optimization of Data Quality and Time to Publishable Results Whether publishing data to communicate to colleagues or submitting to research journals, Dimension FastScan provides the ability to optimize your measurement session to obtain high-quality data ten to hundreds of times faster. A true, practical fast-scanning AFM enables a simplified assessment of complex applications by allowing you to investigate more information sooner. Sample Surveying Applications Sample Surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical...

Complete Suite of Standard and Advanced AFM Modes More Modes = Higher Productivity Superior Application Versatility The Dimension FastScan captures multiple data channels at high speeds, producing more channels of high-quality data. Combined with our many proprietary AFM techniques, modes, and mode enhancements, the FastScan provides the unique capabilities that can take your nanoscale research to the next level. PeakForce TappingTM PeakForce QNMTM PeakForce TUNA PeakForce SSRM Contact Mode Material Mapping FastScan supports Bruker’s patent-pending PeakForce QNM™ Imaging Mode with the Icon Scanner,...

Dimension FastScan Specifications Parameter X-Y scan range Z range Vertical noise floor 10μm typical in imaging and force curve modes, 9.5μm minimum <30pm RMS, height in appropriate environment, typical imaging BW (up to 625Hz) <40pm RMS, sensor in appropriate environment (up to 625Hz) X-Y tip-velocity max. (1% tracking error) X-Y position noise (closed-loop) Z sensor noise level 35pm RMS typical imaging BW (up to 625Hz); 50pm RMS force curve BW (0.1Hz to 5kHz) ≤0.20nm RMS typical imaging BW (up to 2.5kHz in Adaptive) 30pm RMS typical imaging BW (up to 625Hz) Sample size/holder 210mm vacuum chuck...