Dimension Icon
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Dimension Icon Atomic Force Microscope System with ScanAsyst Ultimate Performance Immediate Research-Quality Results Ease of Use with Expert Functionality One Platform — Endless Possibilities Innovation with Integrity Atomic Force Microscopy

Dimension Icon AFM Performance and Productivity Redefined Atomically resolved lattice of mica imaged in contact mode at 0.6Hz. Bruker’s Dimension Icon ® Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the...

Dimension Icon Ultimate Performance The Dimension Icon’s superior resolution, in conjunction with Bruker’s proprietary electronic scanning algorithms, provide the user with a significant improvement in measurement speed and quality. The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of...

with ScanAsyst Powerful AFM Control With the NanoScope V Controller, the Dimension Icon is able to display and capture up to eight images simultaneously with a signal-to-noise ratio previously unseen in a large-sample, tip-scanning AFM. This fifth-generation controller delivers high-speed data capture and high-pixel-density images (5120 x 5120) in eight channels simultaneously, allowing researchers to record and analyze tip-sample interactions that probe nanoscale events at timescales previously inaccessible to AFM. The intuitive graphical user interface provides immediate access to eight...

MORE MODES = HIGHER PRODUCTIVITY Superior Application Versatility The Dimension Icon captures multiple data channels at high speeds, producing more channels of high-quality data. Combined with our many proprietary AFM techniques, modes, and mode enhancements, the Icon provides the unique capabilities that can take your nanoscale research to the next level. Material Mapping: Icon supports Bruker’s patent-pending PeakForce QNM® Imaging Mode, enabling researchers to map and distinquish quanitatively between nanomechanical properties while simultaneously imaging sample topography at high...

lOum typical in imaging and force curve modes, 9.5um minimum Vertical noise floor Sample size/holder Motorized position stage Microscope optics Vibration isolation Acoustic isolation 210mm vacuum chuck for samples, <210mm diameter, <15mm thick Digital zoom and motorized focus Integrates all controllers and provides ergonomic design with immediate physical and visual access Integrated, pneumatic Operational in environments with up to 85dBC continuous acoustic noise Standard: ScanAsyst, PeakForce Tapping, TappingMode (air). Contact Mode, Lateral Force Microscopy, Phaselmaging, Lift Mode, MFM,...