Innova
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Innova Superior AFM Research Performance and Versatility Innovation with Integrity Atomic Force Microscopy

Innova—Superior Research Performance and Versatility The Bruker Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for the physical, life, and material sciences. As a highly configurable and customizable system, Innova also offers application flexibility for the most demanding scientific research at a moderate cost. Its unique state-of-theart closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of openloop operation. Innova delivers atomic resolution with great ease and scans up...

Routine High Resolution All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultra-low noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultra-low noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. With closed-loop noise levels approaching those of open-loop operation, superior image...

High-resolution phase image of C60H122 alkane on graphite Image size 420nm (green image), 700nm (blue image), 380nm (red image). Closed-loop scan linearization active. Note the clear lamellar structure with its approximately 7 .5nm periodicity proving outstanding force control and closed-loop performance. Powerful Research Flexibility Innova’s modern state-of-the-art electronics not only provide exceptionally low noise and outstanding closed-loop performance but also enable a full suite of advanced modes. Core performance and advanced features go hand-in-hand. All advanced modes offer...

Full Range of SPM Modes Available The Innova offers a full complement of SPM techniques, making it ideal for applications ranging from photovoltaics to energy storage, from surface science to device characterization, and from biomolecules to semiconductors. A host of standard and optional scan modes provides complete surface characterization of samples in both air and liquid. Contact Mode TappingMode™ PhaseImaging™ LiftMode Dark Lift Nano-Indentation Nanolithography Open Hardware Access Device synchronization Piezo Response Microscopy Magnetic Force Microscopy (MFM) Electrostatic Force...

Innova Design Features Customizable with open access The Innova SPM provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open design provides flexibility for custom experiments, e.g., by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization. The Innova control electronics provide built-in user access to I/O signals and software-configurable signal routing and processing. Ready for nano-optics The physically open Innova head provides completely...

Closed-loop IV curve probing the phase change of a material with possible memory applications Comparison of the ramp up (red) and ramp down (brown) curves reveals the field- induced change in electrical properties. Current signal is output of 104 V/A amplifier, 5kQ resistor in series. (Sample courtesy of Prof. Wright, University of Exeter.) Piezoforce lithography on thin PZT film.

Sample Size Motorized Z stage Closed-Loop, Large Area Scanner Open-Loop, Small Area Scanner Noise Floor, Z Closed-loop XY noise Z-Linearizer noise Open-loop XY drift Closed-loop XY drift Warm-up Time Open-loop Electronics System Software AFM Modes 45mm x 45mm x 18mm Z travel: 18mm, with pitch and tilt capability XY > 90µm, Z > 7 .5µm XY > 5µm, Z > 1.5µm <50 pm RMS, typical imaging bandwidth <1.2 nm RMS, typical imaging bandwidth <200 pm RMS, typical imaging bandwidth <1nm/ min <3nm/ min 15min 20-bit DAC scan control, 8 x 100kHz +/- 10V ADCs Digital force and position feedback, programmable...