Inspire - Infrared Nanocharacterization System
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Infrared Nanocharacterization System Highest Resolution Nanoscale Chemical, Electrical, and Mechanical Imaging Innovation with Integrity Atomic Force Microscopy

Discover New Structural Detail with Highest Resolution Chemical Imaging Bruker’s Inspire™ is a nanoscale characterization system that extends atomic force microscopy (AFM) into the chemical regime by providing infrared absorption and reflection imaging based on scattering scanning near-field optical microscopy — the most powerful technique for identifying composition at the nanoscale. For the first time, Inspire makes 10-nanometer spatial resolution infrared chemical mapping widely available in an easy-to-use, laser-safe package. Inspire instantly correlates nanochemical information with...

PeakForce Tapping—The Most Significant Advance in Nanocharacterization Bruker’s exclusive PeakForce Tapping permits the use of greatly reduced imaging forces, leading to the most consistent, highest resolution AFM imaging, from the softest biological samples to very hard materials. PeakForce IR™ is a revolutionary new technique that combines scattering SNOM (sSNOM) signal acquisition with PeakForce Tapping feedback, providing the full combined set of information and extending chemical and plasmon imaging to new sample types, such as suspended membranes. PeakForce IR delivers: Nanoscale...

Highest Resolution Nanochemical Imaging on all Materials Most Powerful Chemical Mapping Approach In addition to nanoscale absorption and reflection imaging, Inspire also provides monolayer sensitivity and 10-nanometer lateral resolution, routinely, by employing sSNOM. Inspire succeeds where conventional photothermal approaches fail due to lack of sensitivity and low resolution caused by contact mode imaging. Inspire achieves the highest spatial resolution consistently, from resolving sub-30-nanometer phase separations in block copolymers to detecting monolayers in layered and 2D materials,...

Widest Range of Nanocharacterization and Unique Imaging Modes Inspire goes beyond being an integrated solution for nanoscale chemical and optical imaging. It builds on the extensive set of AFM modes and takes full advantage of PeakForce Tapping technology. For example, images of plasmons on graphene and related effects on other 2D materials are easily generated on Inspire. But what are the electronic properties of grain boundaries that reflect plasmon waves? With PeakForce KPFM, Inspire can accurately, quickly, and easily answer this question. PeakForce KPFM successfully maps workfunction...

Quickest, Easiest, and Safest IR Three Steps to Measurement Success ■ Find hotspot with IR EasyAlign Automated Hyperspectral Imaging mage stack (top) and associated absorption (red) and reflection (black) spectrum, identifying the hourglass shaped domain as PMMA Inspire is the first laser-safe sSNOM system, and the first one that does not require expertise in aligning free-space laser optics. The infrared laser radiation is completely contained, eliminating any chance of exposure. IR EasyAlign™ reduces alignment to pointing and clicking on a new probe position. The interferometer remains...

Easily Customize Your System with Accessories and Options Inspire is a highly expandable platform that can grow with your research needs. You can access additional chemistries by adding more tunable lasers at any time. Adding lasers does not require realignment, and switching between lasers takes only minutes. Bruker makes it easy to further expand Inspire’s AFM capabilities with the widest available selection of AFM accessories and options. Add optional accessories to image in liquid, under electrochemical control, or under temperature control. Or, add optional application modules to...

Integrated and laser-safe scattering SNOM system: Includes all required optics, laser, and detector; High-quality, broadband mid-IR optical components; Lowest noise, liquid N2 -cooled detector; Accurate interferometer control; Tunable quantum cascade laser source with low relative intensity noise; Optimized near-field excitation and collection optics with IR EasyAlign; Additional laser sources can be added Application module-ready AFM head (supports all optional modes) 125 μm x 125 μm X-Y x 5 μm Z range; Other scanner options available upon request NanoScope® V Control Station Intel...