Large-Sample, Non-Contact Measurement & Analysis
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Catalog excerpts

Large-Sample, Non-Contact Measurement & Analysis - 1

NPFLEX 3D Surface Metrology You Make It, We Measure It — Nano to Macro Features Innovation with Integrity Optical & Stylus Microscopy

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Large-Sample, Non-Contact Measurement & Analysis - 2

Delivering New Perspectives on Precision Manufacturing Bruker’s NPFLEX™ 3D Surface Metrology System brings unprecedented flexibility, measurement capabilities, and performance to precision manufacturing industries, enabling faster ramp-up times, improved product quality, and increased productivity. The culmination of decades of expertise in white light interferometric (WLI) technology and large-sample instrument design, the NPFLEX is the first optical metrology system built to handle nano- to macro-features effortlessly on samples of widely varying shapes and sizes. It provides data-rich,...

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Large-Sample, Non-Contact Measurement & Analysis - 3

• High-Performance Metrology Designed for the Rigors of Industry Precision manufacturing requires gage R&R-capable metrology tools that provide reliable, quantitative statistical data for day-to-day process and quality control. Residing on a square, granite surface floating atop a vibration-eliminating air table, the rugged floor-standing NPFLEX ensures precision measurements. The granite base handles up to 170 pounds, and the bridge gantry is designed to provide extreme resistance to vibration commonly found on manufacturing floors. The instrument head is mounted on precisely-aligned posts...

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Unparalled Flexibility in a Precision Metrology Solution Non-destructive characterization of extremely diverse sample types In the past, manufacturers have had to destructively dissect products to measure certain areas of interest. NPFLEX is designed specifically for investigating widely varying sample sizes and shapes without damaging the sample. Insensitive to material type, the system’s WLI technology provides 3D, non-contact measurements of virtually any surface feature. It’s equally adept at imaging in deep trenches, high-aspect ratio holes, and samples with high topographic relief. A...

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Large-Sample, Non-Contact Measurement & Analysis - 5

Many options and configurations for a truly customized solution The NPFLEX system offers many options to customize its operation for specific applications. The Swivel Head option permits repetitive investigation of sidewalls, beveled edges, and angled surfaces. Additionally, there are several stage options available: Rotational stage with optional chuck for holding fixtures Theta rotating stage for sample rotation Phi rotating stage for vertical sample rotation Phi Roller Stage for automated positioning and rotation of smaller, cylindrical samples Automated XY Stage for automated XY...

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Large-Sample, Non-Contact Measurement & Analysis - 6

Automated Processes for Speed and Ease of Use Full-featured software for the fastest, easiest results NPFLEX is powered by Vision64® software, the industry’s most functional and user-friendly graphical user interface. It incorporates the familiar Windows Ribbon design and a toolbar with Windows 7 functionality and features. Intelligent architecture supports an intuitive, visual workflow and enables extensive user-defined automation capabilities. A special Advanced Production Interface (API), designed specifically for operator ease-of-use, is also available. Based on a typical manufacturing...

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Dynamic, customizable tools built in Vision64’s Data Analyzer and Analysis Toolbox epitomize the power and simplicity of Vision64’s design, which incorporates industry-specific analysis routines and ISO standards. Specialized software capabilities support the operator’s efforts for a streamlined, efficient workflow. Results of a 3D-printed part surface analysis, shown in Vision64 user interface. Vision64 includes phase-shifting interferometry (PSI) for testing smooth objects with very high precision with a vertical resolution of 0.1 nanometer; vertical-scanning interferometry (VSI) for true...

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Large-Sample, Non-Contact Measurement & Analysis - 8

Bruker Nano Surfaces Division is continually improving its products and reserves the right to change specifications without notice. © 2014 Bruker Corporation. All rights reserved. NPFLEX and Vision64 are trademarks of Bruker Corporation. All other trademarks are the property of their respective companies. B512, Rev. C4 # Bruker Nano Surfaces Division Cover application images Top: 3D image showing wear on a sliding contact sensor. Tucson, AZ • USA Middle: 3D image showing cross-hatch honed engine bore Phone +1.520.741.1044 with embedded residuals. productinfo@bruker.com Bottom:...

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