LVEM5 Electron Microscope

Product catalog summary

Overview
The LVEM 5 is a compact, benchtop electron microscope that integrates TEM, STEM, and SEM functionalities. It is designed for high-resolution imaging in fields such as biology, medical diagnosis, and materials science, offering the ability to observe unstained samples in their near-native state with high contrast and nanometer resolution.

Design and Features
The LVEM 5 is notable for its small installation space, requiring no dark room or cooling water, making it suitable for personal or group use. It features a Schottky field emission gun for high brightness and coherence, and uses permanent magnet lenses that do not require cooling. The microscope's electron optics are miniaturized and oriented upside down, projecting images onto a YAG screen for further magnification.

Imaging Capabilities
The LVEM 5 supports multiple imaging modes, including TEM, STEM, and SEM, with a spatial resolution of about 2 nm. It allows for high contrast imaging of light elements without heavy metal staining, and can achieve a maximum magnification of approximately 200,000 in TEM mode. The system includes a high-sensitivity digital camera for image capture and analysis.

Applications
The LVEM 5 is suitable for a variety of applications, including life sciences, materials science, and polymer science. It simplifies sample preparation by avoiding staining and shadowing, allowing for observation of real structures without artifacts. The microscope is also beneficial in educational settings, providing hands-on experience with nanoscale imaging techniques.

Technical Specifications
The LVEM 5 features a condenser lens with a focal length of 4.30 mm, an objective lens with a focal length of 1.26 mm, and a projection lens with magnification on the YAG screen ranging from 36 to 470. The electron gun has a current density of 0.2 mA.sr-1 and a lifetime of over 2,000 hours. The system's weight and dimensions are compact, with the electron and light optic system weighing 25 kg.

Distribution and Contact
For more information, contact Delong America Inc. or CORDOUAN Technologies in Europe. The document notes that specifications are subject to change without notice.

Catalog excerpts

Low Voltage Transmission Electron Microscope

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CORDOUAN Technologies, specialized in nanomaterials caracterisation by dynamic light scaterring (DLS) technology joins the Delong Group to introduce in France the rst benchtop transmission electron microscope that combines TEM, SEM and STEM imaging. CORDOUAN Technologies initiates an exclusive partnership with the Delong Group to promote a unique imaging tool : the benchtop transmission electron microscope LVEM 5. Compact & powerful Electron microscopes are indispensable tools for the investigation of objects at the micro and nano scale. The LVEM 5 can help you get the information you need. The...

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Components Field emission gun (FEG) and advanced electron optics The electron gun uses a Schottky eld emitter which provides high brightness and coherence with a lifetime of several thousand hours. The high brightness and small virtual source of the electron gun allows transmission and scanning modes. Permanent magnet lenses, an electrostatic lens and electrostatic stigmators and deectors are used in the electron optics. Permanent magnet lenses are very stable and do not need any cooling. Two-stage magnication The design of the LVEM 5 diers considerably from that of standard TEM. The miniaturized...

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Wide choice of imaging modes The LVEM 5 is the smallest commercial transmission electron microscope in the world. It features all the standard imaging modes that can be found in conventional TEMs and more. The LVEM 5 can work in transmission (TEM – Transmission Electron Microscope) or diraction (SAED – Selected Area Electron Diraction) modes as well as in scanning modes (STEM – Scanning Transmission Electron Microscope and SEM – Scanning Electron Microscope with BSE – Backscattered Electrons) with nanometer spatial resolution. TEM (with SAED) TEM (with SAED) + STEM TEM (with SAED) + SEM TEM (with...

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Technical specications Imaging modes Electron optics Condenser lens (permanent magnet) resolving power focal length* total magnication* the smallest illumination area condensor apertures *depending on the camera ship STEM resolving power minimum magnication Objective lens (permanent magnet) 1.26 mm Cs (spherical aberration coecient) focal length* Cc (chromatic aberration coecient) 0.89 mm resolving power minimum magnication αmax (theoretical aperture angle) objective aperture δteor (theoretical resolution) minimum probe size diraction lens Projection lens (electrostatic) magnication on the YAG...

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Download our application notes at www.cordouan-tech.com The LVEM5 tool will allow you to introduce students to all areas of nanoscale. Real hands-on experience with three dierent types of Nano-imaging techniques commonly used in industry will certainly give your students a competitive edge upon entry into the workforce. Read more... With the LVEM5 you will be able to resolve the sizes of your nanoparticles with improved contrast to understand the quality of your synthesis on a number of levels. You will be able to discern particle size, quantity and distribution. This can all be easily accomplished...

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