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Scaning Electron Microscope

Scaning Electron Microscope

Scaning Electron Microscope

Product catalog summary
Overview: The document provides detailed specifications and features of the Hirox SEM (Scanning Electron Microscope) series, focusing on powerful performance and user-friendly operation. It highlights the capabilities of different models within the series, including SH-3500MB, SH-4000M, and SH-5000M, and their applications across various fields such as material science, semiconductor, biological/pharmaceutical, life science/energy, and education/healthcare.
Specifications:
  • Magnification: Ranges from 30,000x to 100,000x depending on the model.
  • Detectors: Includes SE (Secondary Electron) and BSE (Backscattered Electron) detectors, with options for multi-mode operation.
  • Accelerating Voltage: Variable from 5kV to 30kV.
  • Vacuum Modes: Standard and charge-up reduction modes available.
  • Stage System: 3-axis and 5-axis systems for sample manipulation.
  • Image System: High-speed and low-speed modes with various photo modes for image capture.
  • Automation Functions: Auto start, focus, stigmator, contrast, and brightness.
Applications:
  • Material Science: Analysis of metal, ceramic surfaces, and fiber textures.
  • Semiconductor: Examination of wafers, bonding wires, and micro-patterns.
  • Biological/Pharmaceutical: Study of food, bacteria, and medicinal powders.
  • Life Science/Energy: Research on solar cells, battery electrodes, and catalysts.
Additional Features:
  • Optional EDX System: For elemental analysis and mapping.
  • Multi-Vacuum Mode: Quick operation with sample loading size up to 50mm.
  • Control System: Operates on Microsoft Windows® 7 with Intel® Core™ i5 CPU.
Installation Requirements: Room temperature between 15°C and 30°C, humidity 70% or less, and electric power of single-phase 200~240 AC, 1KW, 50/60Hz.
Conclusion: The Hirox SEM series offers a comprehensive solution for high-resolution imaging and analysis across various scientific and industrial applications, with flexible integration and advanced automation features.
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Catalog excerpts

Scaning Electron Microscope-1

Tabletop Scanning Electron Microscope

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Scaning Electron Microscope-2

Imagine a Higher state of Resolution Major Applications The Hirox SEM series is focused on two essentials: Material Science powerful performance and user-friendly operation. Using the table-top compact configuration, Mini-SEM provides high-resolution, high-magnification SEM images with the ease of use. Auto-focus, Auto-auto brightness and contrast produce an excellent image every time. · Metal / Ceramic Surface, Fiber Texture No doubt about strong performance and flexible integration. 5-axis full stroke control and 4-hole variable aperture of SH-­5000M help fine-resolution SEM image. Built-in...

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Scaning Electron Microscope-3

SH-­5000M Max. 100,000x Magnification SE Detector (Option – BSE Detector) 5kV to 30kV Variable Accelerating Voltage Image Observation Ready within 3 min. 5-axis Strokes – X, Y, R, Z, T 4-Hole Variable Aperture (30 / 50 / 100 / 200 um) Options – EDX System, Cooling Stage, Low Vaccum Control Multi-­Vacuum Mode -­ Standard / Charge Up Reduction SH-­4000M Max. 60,000x Magnification SE Detector & BSE Detector – Multi Mode 5kV to 30kV Variable Accelerating Voltage Multi-Vacuum Mode – Standard / Charge Up Reduction Image Observation Ready within 2 min. 3-axis Strokes – X, Y, R (Option - X,...

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Scaning Electron Microscope-4

Accessories EDS System SDD Type – Nitrogen Free Elemental Detection from Boron (5) to Americium(90) Spectrum Resolution < 133 eV(MnKa) Multi-point Analysis / Line Scan / Elemetal Mapping Ion Sputter Coater MCM-100 Quick and Easy Operation Sample Loading Size - Max. 50mm Target Material - Au(Gold) or Pt(Platinum) Dimension / Weight: 180(W) x 310(D) x 310(H)mm / 15kg BSE Detector SE (Secondary Electron) Image 4-Channel Fixed Type (Solid-State) Composition or Topographic Analysis BSE (Backscattered Electron) Image Excellent atomic number resolution 0.1Z at Z=30 Choice of Detectors for...

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Scaning Electron Microscope-5

I Particle Measurement and Characteristic Analysis ► Industrial Powder - High Molecule, Nano Powder ► Battery Electrode / Pharmaceutical and Biologica Latex Silicon Powder Nano Powder Lactic Acid Bacteria | Material Science and Failure Analysis ► Metal / Plastic and Ceramic / Film Ceramic Sea Animal Rice Flower's Stamen ► Carbon Fiber /Glass Fiber ► CNT (Carbon Nano Tube] Fiber Nano wire CNT (Carbon Nano Tube) Fiber | Electronic Component Observation and Failure Analysis ► Bonding Wire / Micro-Electronics Pattern BGAChip Solarcell Wire Bonding

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Scaning Electron Microscope-6

Electron system Resolution Accelerating Voltage Secondary Electron Image (SEI) Backscattered Electron (BSE) *Multi Mode Backscattered Electron (BSE) *option Standard mode Charge-up reduction mode Standard mode Detector Observation mode Standard mode Charge-up reduction mode Pre-centered Tungsten Filament Cartridge Lens System Two-stage Electromagnetic Condenser Lens One-stage Electromagnetic Objective Lens Stage system Stage Traverse 3-axis System - X, Y-axis : 35mm / R-axis : 360° · Image Shift : ±150 · Chamber CCD Camera · T-axis : 0 to 45°(Option) 5-axis System · X, Y-axis : 40mm / R-axis...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.