Scaning Electron Microscope
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Catalog excerpts

Scaning Electron Microscope - 1

Tabletop Scanning Electron Microscope

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Scaning Electron Microscope - 2

Imagine a Higher state of Resolution Major Applications The Hirox SEM series is focused on two essentials: Material Science powerful performance and user-friendly operation. Using the table-top compact configuration, Mini-SEM provides high-resolution, high-magnification SEM images with the ease of use. Auto-focus, Auto-auto brightness and contrast produce an excellent image every time. · Metal / Ceramic Surface, Fiber Texture No doubt about strong performance and flexible integration. 5-axis full stroke control and 4-hole variable aperture of SH-­5000M help fine-resolution SEM image....

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Scaning Electron Microscope - 3

SH-­5000M Max. 100,000x Magnification SE Detector (Option – BSE Detector) 5kV to 30kV Variable Accelerating Voltage Image Observation Ready within 3 min. 5-axis Strokes – X, Y, R, Z, T 4-Hole Variable Aperture (30 / 50 / 100 / 200 um) Options – EDX System, Cooling Stage, Low Vaccum Control Multi-­Vacuum Mode -­ Standard / Charge Up Reduction SH-­4000M Max. 60,000x Magnification SE Detector & BSE Detector – Multi Mode 5kV to 30kV Variable Accelerating Voltage Multi-Vacuum Mode – Standard / Charge Up Reduction Image Observation Ready within 2 min. 3-axis Strokes – X, Y, R (Option -...

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Scaning Electron Microscope - 4

Accessories EDS System SDD Type – Nitrogen Free Elemental Detection from Boron (5) to Americium(90) Spectrum Resolution < 133 eV(MnKa) Multi-point Analysis / Line Scan / Elemetal Mapping Ion Sputter Coater MCM-100 Quick and Easy Operation Sample Loading Size - Max. 50mm Target Material - Au(Gold) or Pt(Platinum) Dimension / Weight: 180(W) x 310(D) x 310(H)mm / 15kg BSE Detector SE (Secondary Electron) Image 4-Channel Fixed Type (Solid-State) Composition or Topographic Analysis BSE (Backscattered Electron) Image Excellent atomic number resolution 0.1Z at Z=30 Choice of Detectors...

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Scaning Electron Microscope - 5

I Particle Measurement and Characteristic Analysis ► Industrial Powder - High Molecule, Nano Powder ► Battery Electrode / Pharmaceutical and Biologica Latex Silicon Powder Nano Powder Lactic Acid Bacteria | Material Science and Failure Analysis ► Metal / Plastic and Ceramic / Film Ceramic Sea Animal Rice Flower's Stamen ► Carbon Fiber /Glass Fiber ► CNT (Carbon Nano Tube] Fiber Nano wire CNT (Carbon Nano Tube) Fiber | Electronic Component Observation and Failure Analysis ► Bonding Wire / Micro-Electronics Pattern BGAChip Solarcell Wire Bonding

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Scaning Electron Microscope - 6

Electron system Resolution Accelerating Voltage Secondary Electron Image (SEI) Backscattered Electron (BSE) *Multi Mode Backscattered Electron (BSE) *option Standard mode Charge-up reduction mode Standard mode Detector Observation mode Standard mode Charge-up reduction mode Pre-centered Tungsten Filament Cartridge Lens System Two-stage Electromagnetic Condenser Lens One-stage Electromagnetic Objective Lens Stage system Stage Traverse 3-axis System - X, Y-axis : 35mm / R-axis : 360° · Image Shift : ±150 · Chamber CCD Camera · T-axis : 0 to 45°(Option) 5-axis System · X, Y-axis : 40mm /...

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