Sample Preparation and Cross-Section Preparation

Argon ion Polishing Systems of the IM Series Energy systems Polymer fuel cell Ceramic fuel cell (La-Ce/NiO) CIGS solar cell Boron nitride Zinc coating on steel Carbon fibre reinforced plastic The clever alternative to FIB technology The IM series systems are indispensable for SEM sample preparation. They are ideal for when high-quality, millimetre-scale cross-sections or surfaces are needed and conventional mechanical preparation methods don’t give satisfactory results. The two systems IM4000 II and ArBlade 5000 are presented on the following pages. Cross-section preparation Surface polishing...

IM4000 II / IM4000 II-CTC Standard Ar+ cross-section and surface polisher Product Features Extensions and additional functions for IM - Single, robust and maintenance-friendly Penningtype ion gun with independent control of beam current and acceleration voltage. Allows intensive ion beams at all acceleration voltages (0-6kV) - Cross-sectional process depth in Si with 100µm protrusion above mask, stage oscillation +/-30°, is 500µm per hour or more Flatmilling-Set Polishing of grindings up to 50mm Ø and 25mm Ø Cross-section set Preparation of cross sections Active cooling Of cross-sections using...

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