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IM4000II

Product catalog summary

Introduction
The IM4000 II and IM4000 II-CTC systems are essential for SEM sample preparation, particularly when high-quality, millimetre-scale cross-sections or surfaces are required. These systems offer an alternative to FIB technology through argon ion polishing.

Cross-Section Preparation
The systems provide sharp, precisely positionable cross-sections in millimetre widths across various materials, including heat-sensitive polymers. An optional cryogenic version is available for temperature control. The systems accommodate sample heights up to 8mm.

Surface Polishing (Flatmilling)
These systems allow post-processing of mechanically pre-polished surfaces on samples up to 50mm in diameter and 25mm in height. The angle of incidence of the ion beam can be adjusted to achieve different effects, such as surface smoothing and cleaning for EBSD analyses.

Product Features
The IM4000 II features a robust Penning-type ion gun with independent control of beam current and acceleration voltage. It offers a cross-sectional process depth in Si of 500µm per hour. Surface polishing can be performed at tilt angles from 0° to 90°.

Optional Accessories
Accessories include flatmilling equipment, cross-section holders for various sample sizes, a stereo microscope for live observation, and an inert gas transfer function for air protection. The CTC version includes an optimized cryo cross-section holder.

Additional Information
For further guidance, Hitachi High-Tech Europe GmbH provides expert consultation. More information is available on their website or via email.

Disclaimer
This document is the copyright of Hitachi High-Tech Europe GmbH and is intended for general information purposes only. Specifications and designs are subject to change without notice.

Catalog excerpts

Sample Preparation and Cross-Section Preparation

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Argon ion Polishing Systems of the IM Series Energy systems Polymer fuel cell Ceramic fuel cell (La-Ce/NiO) CIGS solar cell Boron nitride Zinc coating on steel Carbon fibre reinforced plastic The clever alternative to FIB technology The IM series systems are indispensable for SEM sample preparation. They are ideal for when high-quality, millimetre-scale cross-sections or surfaces are needed and conventional mechanical preparation methods don’t give satisfactory results. The two systems IM4000 II and ArBlade 5000 are presented on the following pages. Cross-section preparation Surface polishing...

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IM4000 II / IM4000 II-CTC Standard Ar+ cross-section and surface polisher Product Features Extensions and additional functions for IM - Single, robust and maintenance-friendly Penningtype ion gun with independent control of beam current and acceleration voltage. Allows intensive ion beams at all acceleration voltages (0-6kV) - Cross-sectional process depth in Si with 100µm protrusion above mask, stage oscillation +/-30°, is 500µm per hour or more Flatmilling-Set Polishing of grindings up to 50mm Ø and 25mm Ø Cross-section set Preparation of cross sections Active cooling Of cross-sections using...

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Not sure which product aligns with your needs? Our experts are here to provide guidance and help you make the best choice. Speak with an expert More information This publication is the copyright of Hitachi High-Tech Europe GmbH and provides outline information only, which (unless agreed by the company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or regarded as the representation relating to the products or services concerned. The content is provided for general information purposes only. Hitachi High-Tech Europe GmbH’s policy is one...

Open the catalog to page 4