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SU3800/SU3900 Family

Product catalog summary

Overview: The document provides detailed information about the VP-SEM Product Family, specifically the SU3800, SU3800SE, SU3900, and SU3900SE models. These scanning electron microscopes (SEMs) are designed for high productivity and automation, featuring advanced electron optics and sample handling capabilities.

Specifications: The SU3800 and SU3900 models offer two types of electron optics: tungsten and Schottky field emission. They share common software, electronics, and detector platforms. The SU3800 accommodates samples up to 200mm in diameter and 80mm in height, while the SU3900 can handle samples up to 229mm in diameter and 130mm in height. Both models support sample weights of up to 5kg.

Features: Key features include modular VP-SEM platforms, flexible automation via EM Flow Creator, and Hitachi Map 3D packages for enhanced functions like 3D reconstruction and image processing. The SEMs are equipped with highly efficient detectors, including secondary electron detectors for high vacuum and multifunction detectors for low vacuum applications.

Performance: The SEMs offer high-resolution imaging capabilities, with resolutions as fine as 0.9nm at 30kV for the SE models. They support a wide range of analysis techniques, including EDX, EBSD, and cathode luminescence, with stable sample currents adjustable up to 150nA.

Optional Accessories: Optional features include sample airlocks for inert gas transfer, specialised sample holders, and beam deceleration modes for high-resolution imaging at low voltages.

Recommendations: The document advises users to follow the instruction manual for correct operation and notes that specifications are subject to change as new technologies are developed.

Contact Information: For further assistance, users are encouraged to contact Hitachi High-Tech Europe GmbH.

Catalog excerpts

Configure your ideal SEM

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VP-SEM Product Family Air Protection Thermal Tungsten Emitters Modular VP-SEM platform | 2 sample chambers | 2 types of electron optics SU3800 Samples up to 229mm diameter can be fully inspected (SU3900) Multiple sample holder for 33 x 15mm Ø stubs GUI with integrated EDX operation Product Features The SU3800/3900 VP-SEM family focusses on productivity. These tools automate repetitive tasks, so you can achieve reproducible results in a short time with little manual effort. Two different sample chambers with either tungsten or Schottky field emission optics are available. Both SU3800 and SU3900...

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VP-SEM Product Family Configure your ideal SEM Thermal Tungsten Emitters Schottky Emitter Two Specimen Chambers / Eucentric Stages: Up to 200mm Ø, 80mm (H), 2kg sample weight on 5 axes Up to 300mm Ø, 130mm (H), 5kg sample weight on 5 axes Tungsten Hairpin Cathode Schottky Field Emitter The SU3800/SU3800SE is the versatile, standard version of the product family. It features a large analytical sample chamber with a eucentric sample stage, which can be fully pulled out for quick sample changes. The chamber can accommodate samples with a diameter of up to 200mm and a height of 80mm (at the analytical...

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Not sure which product aligns with your needs? Our experts are here to provide guidance and help you make the best choice. Speak with an expert Follow us Hitachi High-Tech Europe GmbH Europark Fichtenhain A12 47807 Krefeld Tel.: +49 2151 6435 300 E-Mail: [email protected] www.hitachi-hightech.com Notice: For correct operation, follow the instruction manual when using the instrument. Specifications in this catalog are subject to change with or without notice, as Hitachi High-Tech Corporation continues to develop the latest technologies and products for our customers. Copyright © Hitachi...

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