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SU7000 | Ultra high resolution Schottky SEM

SU7000 | Ultra high resolution Schottky SEM

SU7000 | Ultra high resolution Schottky SEM

Product catalog summary
Overview of SU7000 Scanning Electron Microscope
The SU7000 is a next-generation Field Emission Scanning Electron Microscope (FE-SEM) designed to meet modern demands for high performance and multifunctionality. It offers wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.

Versatile Imaging Capability
The SU7000 excels in acquiring multiple signals quickly, allowing for a wide range of SEM applications from broad field imaging to sub-nanometer structure visualization. It features newly designed electron optics and detection systems for efficient simultaneous acquisition of secondary and back-scattered electron signals.

Multi-Channel Imaging
The SU7000 can process, display, and save up to six signals simultaneously, enhancing information acquisition and display.

Observation Techniques
The specimen chamber and vacuum system are optimized for large specimen sizes, sample manipulation, variable pressure, cryogenic conditions, and in-situ heating and cooling observations.

Microanalysis
Equipped with a Schottky emitter, the electron gun provides up to 200 nA beam current for various microanalysis applications. The chamber and port layout support multiple analytical options like EDX, WDX, EBSD, and cathodoluminescence.

Enhanced Information Acquisition
The advanced detection system minimizes changes to microscope conditions, streamlining the acquisition of structural, topographical, compositional, and crystallographic information.

Imaging Performance
The SU7000 supports simultaneous image acquisition for surface micro-structural, coating, and topographic information. It offers customizable display modes and supports single and dual-monitor configurations.

Detector Selection and Navigation
The large specimen chamber accommodates specimens up to 200 mm in diameter and 80 mm in height, with 18 accessory ports. The camera navigation feature correlates optical images to target observation areas, enhancing navigation and observation capabilities.

Specifications
  • Resolution: 0.8 nm at 15 kV, 0.9 nm at 1 kV
  • Magnification: 20 to 2,000,000x
  • Accelerating Voltage: 0.1 to 30 kV
  • Probe Current: Max. 200 nA
  • Stage Control: 5-axis motor drive with a movable range of 135 mm (X) x 100 mm (Y)
  • Specimen Size: Max. φ200 mm, Max. 80 mm Height
  • Display: 23-inch LCD, supports dual monitors

Optional Accessories
Includes EDX, WDX, EBSD, cathodoluminescence system, and cryogenic transfer system, among others.
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Catalog excerpts

SU7000 | Ultra high resolution Schottky SEM-1

Science Ring This logo symbolizes Scientific and Analytical instruments of Hitachi High-Tech Group. It is composed with an “S”, standing for "Science", our technology core competency, and with a ring that represents close connection we make with our customers. This “Science Ring” shows how we are committed to create new values by strengthening ties between Science and Society. Notice: For proper operation, follow the instruction manual when using the instrument. Specifications in this catalog are subject to change with or without notice, as Hitachi High-Technologies Corporation continues to develop the latest technologies and products for our customers. Copyright (C) Hitachi High-Technologies Corporation 2018 All rights reserved. ^Hitachi High-Technologies CorporationTokyo, Japanhttp://www.hitachi-hitec.com/global/em/ 24-14, Nishi-shimbashi,1-chome, Minato-ku Tokyo, 105-8717, Japan For technical consultation before purchase, please contact: [email protected] “ responsible sources Ultra-High-Resolution Schottky Scanning Electron Microscope

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SU7000 | Ultra high resolution Schottky SEM-2

The modern FE-SEM requires not only high performance but must also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection. The SU7000 is designed to address these aspects and more by delivering Enhanced information for diversified needs in the field of electron microscopy. Experience the nano-world with the SU7000! 1 Versatile Imaging Capability The SU7000 excels in fast acquisition of multiple signals to address expansive SEM needs, from imaging a wide...

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SU7000 | Ultra high resolution Schottky SEM-3

Imaging Performance Intuitive Graphical User Interface Enhanced information Acquisition Enhanced Signal Display The advanced detection system of the SU7000 streamlines acquisition of structural, topographical, compositional, crystallographic, and other types of information by minimizing changes to microscope conditions, such as working distance or accelerating voltage. ・Customizable display modes. ・Single and Dual-monitor configurations. ・Simultaneous image display up to 4-ch (single) and 6-ch (dual). ・Chamber Scope and SEM MAP for optical stage navigation. Surface micro-structural information...

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SU7000 | Ultra high resolution Schottky SEM-4

Specifications SU7000 The specimen chamber can accommodate a 9 200 mm or 80 mm tall specimen and 18 accessory ports. The large stage travels 135 mm (X) x 100 mm (Y) and can accept maximum 2 kg heavy specimen^*) Large specimen or variable type of sub-stages can be easily mounted on the front-opening large stage door. left: external view of the specimen chamber featuring 18 accessories ports Right: external view of the stage. XY movable range: 135 X 100 mm Left: Picture of the specimen captured by the camera equipped inside the chamber. Right: Camera image transferred to the SEM MAP screen for...

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