NanoRaman brochure
7Pages

r ( | YEARS 1819-2019 HORIBAJOBIN YVON Scientific AFM-Raman, TERS, SNOM Chemical and physical imaging at the nanoscale Technology Automotive Test Systems I Process & Environmental I Medical I Semiconductor I Scientific

Nano TM Raman Key Features M ULTI-SAMPLE ANALYSIS PLATFORM Macro, micro and nano scale measurements can be performed on the same platform. E ASE OF USE Fully automated operation, start measuring within minutes, not hours! T RUE CONFOCALITY High spatial resolution, automated mapping stages, full microscope visualization options. H IGH SPATIAL RESOLUTION Nanoscale spectroscopic resolution (down to 10 nm) through Tip-Enhanced Optical Spectroscopies (Raman and Photoluminescence). Powerful S imultaneous SPM and spectroscopic measurements. H igh numerical aperture objectives from both top and...

AFM-Raman and TERS made easy Reliable AFM-TERS tips TERS Tip Reflection Configuration OmniTM Tip-Enhanced Raman Spectroscopy TERS probes* are designed to acquire topography and Raman spectral information of a sample simultaneously. Raman scattering Field Enhancement Raman scattering The combination of HORIBA's NanoRaman system with OmniTM TERS probes provides the ideal high-enhancement TERS solution. A llow all modes of TERS operation: top, side and bottom optical access M ultilayer structure: tip optimized to minimize interference from silicon substrate in the spectra I nnovative package...

Large area - difficult samples Forsterite 1 Forsterite 2 Enstatite Whitlockite Anorthite Rhodonite Silicon Carbide Raman image - Mineral - Macro map across a sectioned meteorite Raman image - Sectioned pharmaceutical tablet Automatic panoramic AFM (contact mode) – 120 scans – CoCr features on Si surface Sample courtesy of Dr A.N. Shokin, NIIFP; Image courtesy of Dr A. Temiryazev, IRE RAS. AFM (topography) – Zinc oxide nanorods - Z range is 3.6 µm True confocality - 3D maps Bead Raman image - XYZ volume map of expanded polymer bead in matrix High spectral resolution - High selectivity Quartz...

9 µm AFM – Bacillus Cereus vegetative cells MFM - Yttrium Iron Garnet (YIG) film Sample courtesy of Dr. A.V. Maryakhin Lateral Force Modulation – Polymer-fullerene blend (P3HT:PCBM) KPFM – DTP (pentacene derivative) on gold Nano Lithography – Vector force scratching on polycarbonate AFM in liquid – plasmid DNA on mica Tip-Enhanced Raman Spectroscopy CH stretching (Polymer) G band (Graphene) 2D band (Graphene) 400 nm AFM and TERS images - Patterned graphene oxide flake by “pulsedforce lithography” 600 nm KPFM and TERS images – Graphene Oxide (COOH functionalized) flakes on gold 500 nm AFM...

Integrated Software NanoRaman data acquisition with ONE software Key Features O NE SOFTWARE for the acquisition of all the NanoRaman platform techniques (AFM, Raman, Photoluminescence, co-localized measurements and TERS) LabSpec 6 SPECTROSCOPY SUITE for Integrated Multivariate and high level analysis at a touch of a button. PCA, MCR, HCA, DCA. U NIQUE IMAGING MODES and processing, including: Spec-TopTM mode Original TERS imaging mode: TERS measurement is performed when the tip is in direct contact with the surface, transition between the pixels of the map is performed in semicontact mode,...

Find out more at www.horiba.com/nanoraman Worldwide Training and Technical Support Jobin Yvon, established in 1819, and now part of the HORIBA Scientific is one of the world's largest manufacturers of analytical and spectroscopic systems and components. The HORIBA Scientific teams are committed to serving our customers with high performance products and superior technical support. A = 325-1064nm P < 500mW VISIBLE AND/OR INVISIBLE LASER RADIATION AVOID EXPOSURE TO BEAM CLASS 3B LASER PRODUCT Our staff of experienced application and service engineers, located around the world, provides full...