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XGT-9000Series X-ray Analytical Microscope

XGT-9000Series X-ray Analytical Microscope

XGT-9000Series X-ray Analytical Microscope

Product catalog summary
Overview of XGT-9000 Series: The XGT-9000 Series is a micro-XRF spectrometer designed for non-destructive elemental analysis of materials. It offers high sensitivity and a wide range of detectable elements, suitable for applications in geoscience, forensic analysis, electronics testing, and more.
Specifications:
  • Instrument Principle: Energy dispersive X-ray fluorescence spectroscopy.
  • Detectable Elements: From F (9) to Am (95) under whole vacuum conditions.
  • Chamber Size: 680 mm (W) x 860 mm (D) x 760 mm (H).
  • Maximum Sample Mass: 1 kg.
  • Maximum Mapping Area: 100 mm x 100 mm on a 300 mm (W) x 250 mm (D) stage.
  • X-ray Generator: Up to 50 W, 50 kV, 1 mA with Rh target material.
Key Features:
  • Multiple Probes: Includes options from 10 µm to 1.2 mm, with ultra-high intensity probes.
  • Measurement Environments: Whole vacuum, partial vacuum, whole ambient, and optional He purge.
  • Imaging Capabilities: Simultaneous imaging of fluorescent and transmission X-rays.
  • Optical Design: Vertical-coaxial X-ray and optical observation with adjustable focus.
Operating Modes: Supports single point, multi-points, and mapping analyses for flexible measurement approaches.
Compliance and Standards: Integrates ISO9001, ISO14001, ISO45001, and ISO22301 standards for quality, environmental management, occupational health and safety, and business continuity.
Applications:
  • Geoscience/Mineralogy: Elemental composition identification.
  • Fuel Cells: Non-destructive composition analysis.
  • Forensic: Trace evidence identification.
  • Semiconductor: Coating thickness measurement.
  • Archaeology: Origin investigation of artifacts.
  • Electronics: Failure analysis and RoHS testing.
  • Biological Samples: Analysis without compromising sensitivity to light elements.
Software Suite: Offers image processing, particle detection, and multivariate analysis, supporting unattended mode with a queue function and customizable GUI.
Complementary Techniques: Combines XRF and Raman spectroscopies for comprehensive material analysis.
Sample Holders: Various holders available for different sample types, with a modular stage design for easy changes.
Conclusion: The XGT-9000 Series provides a comprehensive solution for detailed elemental analysis across various fields, offering flexibility in probe selection and measurement environments to suit specific application needs.
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Catalog excerpts

XGT-9000Series X-ray Analytical Microscope-1

X-ray Analytical Microscope XGT-9000 Series XGT-9000 Series X-ray Analytical Microscope Look Below The Surface

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XGT-9000Series X-ray Analytical Microscope-2

- 9000 - 9000Series XGT XGT SeriesX-ray X-ray Analytical Analytical Microscope Microscope What What is is the the XGT-9000 XGT-9000 Series? Series? TheThe XGT-9000 XGT-9000 Series Series is aismicro-XRF a micro-XRF spectrometer, spectrometer, which which provides provides non-destructive non-destructive elemental elemental analysis analysis of materials. of materials. Single Single point, point, multi-points multi-points andand mapping mapping analyses analyses cancan be done be done by one by one instrument. instrument. X-ray guide X-raytube guide (Probe) tube (Probe) Fluorescent Fluorescent...

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XGT-9000Series X-ray Analytical Microscope-3

Unique Unique key key features features Multi-probes Multi-probes including including most most advanced advanced 15 15 µmµm ultra-high ultra-high intensity intensity The XGT-9000 The XGT-9000 Series Series provides provides a wide a wide selection selection of probe. of probe. (a) (a) Multi-probes Multi-probes can be caninstalled be installed in theininstrument the instrument and switchable and switchable on the onsoftware. the software. Two Two ultra-high ultra-high intensity intensity probes probes of 15ofµm 15and µm and 100 µm 100can µm be canchosen. be chosen. to select> - 10 µm - 10probe...

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XGT-9000Series X-ray Analytical Microscope-4

- 9000 - 9000Series XGT XGT SeriesX-ray X-ray Analytical Analytical Microscope Microscope The The XGT-9000 XGT-9000 Series: Series: Wide Wide range range ofof applications applications Lithium-ion Lithium-ion battery: battery: Foreign Foreign particle particle analysis analysis Spectrum Spectrum Particle Particle screening screening Optical Optical imageimage The The XGT-9000 XGT-9000 Series Series can can detect detect and and Cu Cu determine determine the composition the composition of foreign of foreign particles, particles, and therefore and therefore tracktrack the source the source of contamination....

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XGT-9000Series X-ray Analytical Microscope-5

Geoscience/Mineralogy: Geoscience/Mineralogy: Elemental Elemental composition composition identification identification The The XGT-9000 XGT-9000 Series Series can be canequipped be equipped withwith various various probes probes and and spotspot sizessizes providing providing comprehensive comprehensive and and detailed detailed understanding understanding of geological of geological and mineral and mineral samples. samples. Chemical Chemical phase phase distribution distribution can can be obtained be obtained withwith L abspec L abspec LinkLink function function (see (see pagepage 7) 7) Sample:...

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XGT-9000Series X-ray Analytical Microscope-6

- 9000 - 9000Series XGT XGT SeriesX-ray X-ray Analytical Analytical Microscope Microscope The The XGT-9000 XGT-9000 Series Series Software Software Suite Suite Simple Simple and and rich rich GUI/Customizable GUI/Customizable windows/Advanced windows/Advanced functions functions The user The user interface interface offersoffers a flexible a flexible way to way measure to measure multiple multiple samples samples or areas or areas in unattended in unattended modemode (queue (queue function), function), display display the analytical the analytical results, results, present present the data, the...

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XGT-9000Series X-ray Analytical Microscope-7

DoDo more more with with your your HORIBA HORIBA XRF XRF Combination Combination of XRF of XRF andand Raman Raman Spectroscopies Spectroscopies XRF XRF and Raman and Raman spectroscopies spectroscopies are complementary are complementary techniques. techniques. XRF XRF provides provides information information about about elemental elemental composition composition of theofmaterial, the material, whereas whereas Raman Raman offersoffers molecular molecular information. information. Co-localized Co-localized measurements measurements between between the XGT-9000 the XGT-9000 Series Series and...

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XGT-9000Series X-ray Analytical Microscope-8

*Under whole vacuum condition IMS The HORIBA Group adopts IMS (Integrated Management System) which integrates Quality Management System ISO9001, Environmental Management System ISO14001, and Occupational Health and Safety Management System ISO45001. We have now integrated Business Continuity Management System ISO22301 in order to provide our products and services in a stable manner, even in emergencies. y/j\ Please read the operation manual before using this product to assure safe and proper handling of the product. •The specifications, appearance or other aspects of products in this catalog...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.