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JCM-6000Plus
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Catalog excerpts

JCM-6000Plus - 1

With the JCM-6000's highly-regarded touch-panel operating environment, the JCM-6000Plus has been further enhanced with a high-sensitivity backscattered electron detector providing high quality images, achieving a high-end, high-performance benchtop scanning electron microscope that is entirely user-friendly. Touch panel & Simple GUI ”Easy” image acquisition Improved image quality High-vacuum mode and Low-vacuum mode provided as standard Element analysis Sample : Azulite Low-vac. BED-S Accelerating voltage : 15 kV Magnification : × 50 Sample : Patterns on Si High-vac. SED Accelerating voltage : 15 kV Magnification : × 5,000 Sample : Bacillus substilis natto High-vac. SED Accelerating voltage : 15 kV Magnification : × 40,000

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JCM-6000Plus - 2

Sample : Ptwire High-vac. Accelerating voltage : 15 kV Magnification : x 7,000 Specifications Magnification Imaging mode Accelerating voltage Electron gun Bias current Condenser lens Objective lens Auto magnification correction Preset magnification Specimen stage Maximum sample size Specimen exchange Image memory Pixels Image processing Automated functions Metrology File format Computer Monitor Evacuation system Secondary electron image : x 10 to x 60,000 Backscattered electron image : x 10 to x 30,000 (when image size is 128 mm x 96 mm) Secondary electron image, Backscattered electron...

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