JEOL Products Guide

Introduction Thank you for your interest in JEOL products and services. JEOL designs and manufactures scientific instruments for high-level research and development activities. Our customers include scientists and engineers working in leading-edge academic and industrial laboratories around the world. JEOL products and services enable them to pursue a variety of R&D applications that require high resolution imaging and analytical capabilities such as: basic observation and analysis, environmental science, information technology, semiconductor production, biotechnology, nanotechnology, and a broad...

| JEM-ARM300F2 GRAND ARM™2Atomic Resolution Analytical Electron Microscope The JEM-ARM300F2 GRAND ARM™2 is JEOL’s flagship EM that combines ultrahigh spatial resolution observation and high sensitivity X-ray analysis at a wide range of accelerating voltage from low acceleration to high acceleration. With the adoption of a new enclosure cover that can reduce the effect of environment changes as well as improved acoustic noise resistance of the column, the ultimate microscope stability has been realized. • STEM Resolution: 0.053 nm (FHP2, 300 kV, with STEM Corrector) • TEM Resolution: 0.050 nm...

| JEM-ACE200FHigh Throughput Analytical Electron Microscope The JEM-ACE200F is an electron microscope responding to the system allowing for an operator to obtain data without operating the electron microscope by creating recipes for operation workflow. Since the JEM-ACE200F inherits hardware technologies of the JEM-ARM200F high-end TEM and the JEM-F200 multi-purpose FE-TEM, this high-throughput analytical electron microscope provides superbly high stability and analytical capabilities with a renewed sophisticated exterior design. • STEM Resolution: 0.10 nm (200 kV, with STEM Corrector) • Accelerating...

Scanning Electron Microscopes Schottky Field Emission Scanning Electron Microscope The JSM-IT810 series leads our SEM product line allowing for the acquisition of the best ultra-highresolution data with unprecedented ease. Optimum performance is driven by JEOL advanced technology incorporating our in-lens Schottky plus field emission electron gun, electron optical control system-Neo Engine, as well as our SEM Center instrument control software. This series can be equipped with a our fully embedded JEOL energy dispersive X-ray spectrometer (EDS) for real-time elemental information. In addition,...

| JSM-IT510Scanning Electron Microscope The JSM-IT510 is the most versatile of our thermionic-emission SEMs and comes with a large multipurpose chamber that can accommodate large specimens (200 mm dia.). This multipurpose SEM with smart analytical port design can accommodate not only multiple EDS but also EBSD and WDS etc. This JSM-IT510 can also be equipped with a LaB6 electron gun, for applications requiring higher brightness and longer source lifetimes. • Resolution: High Vacuum Mode: 3.0 nm (30 kV), 15.0 nm (1.0 kV) 2.0 nm (30 kV), 12.5 nm (1.0 kV) *LaB6 electron gun Low Vacuum Mode: 4.0...

Ion Beam Application Equipment FIB-SEM System The JIB-PS500i combines the high image quality, high-resolution SEM and high-performance FIB enabling accurate and high-quality TEM specimen preparation at the intended area of the specimen. The large specimen stage with large tilt angles makes it easy to perform TEM specimen preparation such as trimming specimen blocks. Check and Go function enables a screening check of prepared specimens with a newly-developed STEM detector. The use of the double-tilt cartridge and TEM holder facilitates a linkage of FIB and TEM. ● SEM resolution: 0.7 nm at 15 kV,...

Peripheral Equipment SXES Series Energy dispersive X-ray spectrometer Soft X-ray Emission Spectrometer Series Dry Pumping Multi Station Auto Fine Coater Carbon Coater Smart Coater Linked Optical and Scanning Electron Microscope System Scientific/Metrology Instruments

Instruments for Microarea and Surface Analysis JXA-iHP200F/JXA-iSP100 Electron Probe Microanalyzer The JXA-iHP200F and JXA-iSP100 are integrated EPMA with enhanced features, achieving more efficient operations from observation to analysis based on the concept “anyone can easily perform microanalysis in defined regions of interest”. Functions to realize high throughput such as Auto Loader, Stage Navigation System, and “Live Analysis” function are equipped as standard. Moreover, as JXA-iHP200F and JXA-iSP100 have high expandability, they can serve for diversified analysis purpose by incorporating...

X-ray Fluorescence Spectrometers Energy-dispersive X-ray fluorescence spectrometer The JSX-1000S is an energy dispersive X-ray fluorescence spectrometer that provides high-sensitivity and high-throughput analysis across its entire energy range and can employ up to nine filters. Features include built-in recipes which automate analyses based on specific applications or sample categories (ex. ROHS), Smart FP method for accurate standard-less quantitative analysis and helium-free light element analysis in liquid by utilizing our Low Vacuum Capsule option. Electron Diffractometer XtaLAB Synergy-ED...

Mass Spectrometers Multi-ionization Unknown Compounds Analysis System Dual stage Reflectron TOF Materials are getting more complex, our environment is diversifying, and hundreds of new chemicals are created every day. The Multi-ionization Unknown Compounds Analysis System MultiAnalyzer performs structure analysis even for unknown compounds and provides answers to such complicated and challenging problems. We are committed to provide high throughput, high quality analysis results with MultiAnalyzer. MultiAnalyzer GC column Cathode Multi ionization Gas Chromatograph - Quadrupole mass spectrometer...

Headspace Autosampler The MS-62071STRAP is a new-generation headspace sampler (HS) employing sorptive trap and providing ultra-high sensitivity measurement, which was not possible with the conventional HS sampler using a sample loop. In addition, the HS-GCMS system, combined with a JMS-Q1600GC, guarantees detection of mold odor in water down to 1 ppt. Photo: JMS-Q1600GC + Headspace autosampler system Mass Spectrometer Dedicated to Dioxin Analysis The JMS-800D UltraFOCUS™, conforming to international standards on dioxin analysis, including EPA, EN, and JIS methods, focuses on analysis of ultra-trace...