DM1750 M
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Catalog excerpts

DM1750 M - 1

Upright Microscopes for Routine Applications in Materials Examinations Leica DM750 M Leica DM1750 M Leica DM2700 M

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DM1750 M - 3

LEICA DM750 M / DM1750 M / DM2700 M MATERIALS EX AMINATIONS FROM DIFFERENT ANGLES PERFECTLY TAILORED FOR YOUR APPLICATION Putting your materials examinations in the best light The ergonomic operation of the Leica DM2700 M for the best imaging quality is our goal. You will combines brilliant imaging and a new level of comfort experience how quickly and reliably materials exami- while working. It has never been so easy to operate nations can be carried out with the simple operation of the Leica DM750 M entry-level microscope. With And with a Leica microscope, you can count on a the advanced...

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DM1750 M - 4

LEICA DM750 M The economic solution for sample preparation laboratories and for simple routines in materials examination With its unbeatable cost-to-performance ratio, the Leica DM750 M sets a new benchmark in routine materials microscopy. You have all essentials in view - depending on the composition of the sample, even from different LED illumination angles. Simply see more and obtain more meaningful examination results, while performing quality control, damage analysis, and materials testing. The brilliant optics and the simple, secure handling of this stand will make your work easier....

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DM1750 M - 5

1, 2: Aluminum-silicon, brightfield; Copper-zinc deformation line

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DM1750 M - 6

Ferrite C35, hypoeutectoid pearlite. N Plan 100×, brightfield Ferrite C35, hypoeutectoid pearlite. N Plan 100×, oblique illumination

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DM1750 M - 7

LEICA DM750 M / DM1750 M / DM2700 M MATERIALS EXAMINATIONS FROM DIFFERENT ANGLES 7 LEICA DM1750 M Focus on the tasks in the lab The new Leica DM1750 M microscope was developed for routine use, even in difficult ambient conditions, and for imaging large samples. Built sturdy and solid, the Leica DM1750 M has excellent optics from Leica Microsystems and, with regard to the size of your samples, gives you plenty of room to maneuver. You have the option of varying the power LED illumination angle and adjusting it to best view the sample. Unique for a materials microscope in this class, the...

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DM1750 M - 8

Ferrite C60, hypoeutectoid pearlite, N Plan 50×, BF Ferrite C60, hypoeutectoid pearlite, N Plan 50×, DF Ferrite C60, hypoeutectoid pearlite, N Plan 50×, DIC

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DM1750 M - 9

LEICA DM750 M / DM1750 M / DM2700 M MATERIALS EXAMINATIONS FROM DIFFERENT ANGLES 9 LEICA DM2700 M Comfort and convenience are not a luxury Along with high-quality optics, the Leica DM2700 M provides working comfort, which is one-of-a-kind in this class. You work with a standard instrument for routine tasks, but make no compromises in performance and configuration. The microscope completely adapts to the individual user to prevent muscle tension, poor posture, and long-term health hazards. Microscopy has never been more comfortable and simple. MAIN BENEFITS SIMPLE, MORE SECURE, EXTENDABLE:...

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DM1750 M - 10

THE STRONG TEAM PLAYERS One for all – LAS microscope software with many modules LEICA APPLICATION SUITE (LAS) LAS is the universal software platform for microscopes and digital cameras from Leica Microsystems. In combination with Leica DFC cameras with FireWire connection, an optimally matched analysis and inspection system can be designed according to your requirements, for example, to perform grain size determination or for phase control. Expanding a documentation system for the analysis of inclusions in steel, for example, is as easy as adding a module. LEICA GRAIN EXPERT Grain boundary...

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DM1750 M - 11

LEICA DM750 M / DM1750 M / DM2700 M MATERIALS EXAMINATIONS FROM DIFFERENT ANGLES 11 LEICA DM750 M / DM1750 M / DM2700 M MATERIALS EXAMINATIONS FROM DIFFERENT ANGLES 11 LEICA PHASE EXPERT Phase analysis is a routine but advanced analysis task for materials and metallurgy labs. Time and efficiency play a big role when carrying it out. With Leica Phase Expert, you can perform automatic, objective, and reproducible measurements of multi-phased microstructures using easily visible colors or contrasts. Different components can be analyzed in oil shale due to their reflectivity just as fast and...

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DM1750 M - 12

LEICA and the Leica Logo are registered trademarks of Leica Microsystems IR GmbH. Evaluates the high-quality images provided by the Leica microscopes. The LAS software combines the newest developments in automated microscopy, data processing, and digital image analysis. 13IDE45010EN • Copyright © by Leica Microsystems (Schweiz) AG, CH-9435 Heerbrugg, 2015. Subject to modifications. LEICA CAST IRON EXPERT Inverted, manual microscope for materials analysis, industrial quality inspection and assurance, and the development of new materials. Manual or fully automated research microscope with a...

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