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NIRS XDS Process Analyzer ? DirectLight/NonContact

NIRS XDS Process Analyzer ? DirectLight/NonContact

NIRS XDS Process Analyzer ? DirectLight/NonContact

Product catalog summary
Features and Benefits
  • Non-destructive in-line Near-Infrared (NIR) analysis of moving products.
  • Non-contact reflectance measurements directly in the product line.
  • Applicable over conveyor belts and webs for both homogeneous and non-homogeneous products.
  • Wavelength range from 800 nm to 2,200 nm.
  • NEMA 4X/IP65 rated, with a measuring head made of IP69K stainless steel.
Product Overview

The NIRS XDS Process Analyzer – DirectLight/NonContact utilizes XDS near-infrared technology for real-time, non-contact process analysis. It provides accurate, non-destructive measurements for products in motion, such as those on conveyor belts or sheets. This technology is suitable for quality control of various materials including fibers, sheets, laminates, and web-based products like plastics, papers, and textiles.

Description

The measurement head is connected to an optical fiber, with a high-intensity light source illuminating the sample. The light interacts with the sample and is reflected back to the sensor head, where it is collected and analyzed. The robust design ensures consistent and reliable performance even in harsh chemical environments.

Specifications
  • Measurement Mode: Reflectance
  • Wavelength Range: 800-2,200 nm
  • Detector: Extended InGaAs (Indium Gallium Arsenide)
  • Data Increment: 0.5 nm
  • Wavelength Accuracy: < 0.08 nm
  • Wavelength Precision: < 0.004 nm (SD)
  • Noise: < 100 micro AU
  • Sensor Height: 4.0-10.0 inches (100-250 mm) from sample
Standards and Approvals

The analyzer is CE labeled and complies with directives such as EMC Directive 2004/108/EC, LVD Directive 2006/95/EC, Packing and Waste Directive 94/62/EC, and RoHS Directive 2002/95/EC.

Installation Requirements
  • Power Supply: 100-240 VAC, 50-60 Hz, 1A, max. 300 W
  • Operating Temperature: 5-35 °C (40-95 °F)
  • Ambient Humidity: 10-90% relative
  • Weight: 93 lbs (42.2 kg)
  • Dimensions: 19 × 24 × 14 inches (457 × 572 × 387 mm)
  • Enclosure: Basic unit IP65/Nema 4X stainless steel, with IP69K options for humid environments
  • Process Communication: Options for OPC, Modbus, Profibus, etc.
Ordering Information
  • 2.928.0310 NIRS XDS Process Analyzer – DirectLight/NonContact
  • 6.6069.102 Vision software
  • Various NIRS Certified Process Reflectance and Wavelength Standards
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Catalog excerpts

NIRS XDS Process Analyzer ? DirectLight/NonContact-1

NIRS XDS Process Analyzer – DirectLight/NonContact Features and benefits • Non-destructive in-line Near-Infrared (NIR) analysis of moving product • Non-contact reflectance measurements directly in the product line • Use over conveyor belts, webs for homogeneous or non-homogeneous products • Wavelength range of 800 nm to 2’200 nm • NEMA 4X/IP65 rated, measuring head IP69K stainless steel

 Open the catalog to page 1
NIRS XDS Process Analyzer ? DirectLight/NonContact-2

Based on XDS near-infrared technology, the NIRS XDS Process Analyzer – DirectLight/NonContact provides the next generation of non-contact process analyzers for realtime analysis. Non-destructive, accurate measurements are perfor­­ med wher­­ ever a product is moving and accessible, for in­­ stance, above a conveyor belt, web or sheet. The measurement head is attached at the terminal end of an optical fiber. A high-intensity light source contained in the sensor head illuminates the sample. Light interacts with the sample and is reflected back to the sensor head, picked up by the collection fiber...

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NIRS XDS Process Analyzer ? DirectLight/NonContact-3

Specifications Measurement mode Wavelength range Detector Increment Wavelength accuracy Wavelength precision Noise Sensor Height Reflectance 800-2’200 nm Extended InGaAs (Indium Galium Arsenide) Data 0.5 nm < 0.08 nm < 0.004 nm (SD) < 100 micro AU 4.0-10.0 inches (100-250 mm) from sample Standards and Approvals The NIRS XDS Process Analyzer – DirectLight/NonContact is CE labeled and complies with the following directives: • EMC (Electro Magnetic Compatibility) Directive 2004/108/EC • LVD (Low Voltage Directive) 2006/95/EC • Packing and Waster Directive 94/62/EC • RoHS Directive 2002/95/EC Installation...

 Open the catalog to page 3
NIRS XDS Process Analyzer ? DirectLight/NonContact-4

Ordering Information 2.928.0310 NIRS XDS Process Analyzer – DirectLight/NonContact Software 6.6069.102 Vision software Standards 6.7450.070 NIRS Certified Process Reflectance and Wavelength Standard (1") 6.7450.080 NIRS Certified Process Reflectance and Wavelength Standard (0.5") 6.7450.090 NIRS Certified Process Reflectance and Wavelength Standard (1", 45 degrees) 6.7450.100 NIRS Certified System2 Reflectance Standards (set of 7 pc.) 6.7450.110 NIRS Certified System2 Transmission Standards (set of 6 pc.) Subject to modifications Layout by Ecknauer+Schoch ASW, printed in Switzerland by Metrohm...

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.