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High Content Microscopy
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High Content Microscopy

High Content Microscopy
1 /2Pages

Catalog excerpts

High Content Microscopy-1

High-Content Microscopy DELIVERING: FLEXIBILITY Combine high-speed peripheral device choices for an integrated high-content imaging system with optional automated plate delivery, fast autofocusing, wavelength switching, and an interchangeable camera. Configuration of experimental job runs is streamlined with easy-to-use setup tools. The integrated database offers centralized organization and display of acquired images, sample labeling, binary overlays, heat maps and filtering for seamless data review and export. Custom and built-in analysis routines available for multiplexing during and post acquisition. HIGH-CONTENT IMAGING FOR YOUR DEVELOPING PROJECTS Nikon’s comprehensive High-Content Imaging System merges the entire functionality of the Ti + Perfect Focus microscope that researchers are accustomed to with interchangeable choices for high-speed piezo-based autofocusing, plate handling, various light sources, fast wavelength switching, and the full range of camera model support. In addition, magnification and fluorescence filters are exchangeable, extending imaging possibilities and experimental assay design options. The new high-content-microscope-based system delivers the option for researchers to facilitate their experimental protocols by coupling the industry-leading Ti-E microscope, high-speed camera and peripheral device choices with the power of NIS-Elements HC software capabilities. This synergy and Nikon’s imaging expertise provide a new avenue for addressing high-content imaging challenges. Powered by High Content Analysis

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High Content Microscopy-2

High Content imaging system enhances efficiency of your experimental workflow Plate Definition Sample Definition Sample Labeling Sample labeling Acquired images Data Output ■ Specifications High Content Analysis System Motorized inverted microscope ECLIPSE Ti-E Compatible well plate types Center, Covering, Random, Random +Center and Regular pattern in each well Illumination methods Fluorescence, Phase contrast, DIC Image acquisition Multichannel, Time lapse, Multidimensional imaging Acquisition speed 2 min/96 well plate (1 point/well, 30 msec/shot, without Z stacking, PFS (Perfect Focus System))...

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All Nikon Instruments catalogs and technical brochures

  1. HCA

    8  Pages

  2. DS-Fi3

    16  Pages

  3. TI-E

    32  Pages

  4. ECLIPSE TS2

    8  Pages

  5. ECLIPSE TS2R

    8  Pages

  6. N-SIME

    6  Pages

  7. N-SIM N-STORM

    24  Pages

  8. ECLIPSE Ti2

    24  Pages

  9. Eclipse Ti

    32  Pages

  10. C2 Plus

    16  Pages

  11. SMZ18

    16  Pages

  12. N-SIM E

    4  Pages

Archived catalogs

  1. A1 MP+ / A1R MP

    15  Pages

  2. ShuttlePix

    8  Pages

  3. Eclipse FN1

    12  Pages

  4. MiBrochure

    2  Pages

  5. AZ_C1

    2  Pages

  6. C2+_2CE-SCHH-5

    16  Pages

  7. N-STORM 4.1

    13  Pages

  8. A1_MP

    11  Pages

  9. A1+ / A1R+

    13  Pages

  10. NIS-Elements

    8  Pages

  11. AZ100M

    8  Pages

  12. Eclipse Ni

    15  Pages

  13. AZ100

    4  Pages

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.