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N-SIM E

Product catalog summary

Overview: The N-SIM E is a super-resolution microscope utilizing structured illumination microscopy (SIM) technology to achieve double the spatial resolution of conventional optical microscopes, approximately 115 nm. It is designed to be a cost-effective solution for individual labs, supporting essential excitation wavelengths and imaging modes.

Key Features:

Resolution: Achieves approximately 115 nm lateral resolution and 269 nm axial resolution in 3D-SIM mode.
Imaging Speed: Capable of fast imaging with a temporal resolution of approximately 1 second per frame, suitable for live-cell imaging.
3D-SIM Mode: Offers axial super-resolution imaging with optical sectioning at 300 nm resolution. Two reconstruction methods are available: Slice 3D-SIM and Stack 3D-SIM for thicker specimens.
Multi-Color Imaging: Equipped with a compact LU-N3-SIM laser unit supporting three common wavelengths (488/561/640 nm) for multi-color super-resolution imaging.

Technical Specifications:

Compatible Objectives: Configurable with 100x oil immersion or 60x water immersion objectives.
Camera: Utilizes the ORCA-Flash 4.0 sCMOS camera from Hamamatsu Photonics.
Software: Operates with NIS-Elements Ar and NIS-Elements C software, requiring additional modules for analysis.
Operating Conditions: Optimal performance between 20 ºC to 28 ºC.

Applications: The N-SIM E is suitable for detailed visualization of intracellular structures and their functions, demonstrated in various biological specimens such as B16 melanoma cells, HeLa cells, Bacillus subtilis, and mouse keratinocytes.

Principle of Operation: The system uses high spatial frequency laser interference to illuminate sub-resolution structures, producing moiré fringes. These fringes are processed to extract super-resolution information, effectively doubling the resolution limit of conventional optical microscopes.

Safety and Compliance: The system complies with ISO 9001 and ISO 14001 certifications and adheres to laser safety standards, including IEC/EN60825-1:2007.

Catalog excerpts

Super Resolution Microscope N-SIM E Super Resolution Microscope

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A personal super-resolution microscope that provides the same high resolution as the N-SIM Utilizing structured illumination microscopy (SIM) technology, the N-SIM E realizes double the spatial resolution of conventional optical microscopes (to approximately 115 nm). N-SIM E is a streamlined, affordable super-resolution system supporting only essential, commonly used excitation wavelengths and imaging modes, making it an obvious choice for individual labs. Double the resolution of conventional optical microscopes The N-SIM E utilizes Nikon’s innovative new approach to “structured illumination...

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3-color multi-laser super-resolution capability The compact LU-N3-SIM laser unit dedicated for N-SIM E is installed with the three most commonly used wavelength lasers (488/561/640), enabling super-high resolution imaging in multiple colors. Objectives for super-resolution microscopes The system can be configured with either a 100x oil immersion type, which is suitable for the imaging of fixed samples, or a 60x water immersion type, which is optimal for time-lapse live-cell imaging. The SR (super resolution) objectives have been designed to provide superb optical performance with Nikon’s super-resolution...

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Specifications Lateral resolution (FWHM of beads in xy) Axial resolution (FWHM of beads in z) Image acquisition time Compatible objective Up to 1 sec/frame (Slice 3D-SIM) (requires additional 1-2 sec. for calculation) System can be configured with either 100x or 60x CFI SR Apochromat TIRF 100×oil (NA1.49) CFI Apochromat TIRF 100×oil (NA1.49) CFI SR Plan Apochromat IR 60×WI (NA1.27) CFI Plan Apochromat IR 60×WI (NA1.27) ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.) Imaging mode 3D-SIM Reconstruction method: Slice 3D-SIM, Stack 3D-SIM (option) Multi-color imaging NIS-Elements Ar NIS-Elements...

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N-SIM E

N-SIM E

Catalog excerpts

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