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TopMap Success stories

TopMap Success stories
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TopMap Success stories

Product catalog summary
Foreword
The CEO of Polytec GmbH, Dr. Dietmar Gnass, emphasizes the growing need for optical surface inspections, highlighting the importance of reducing measurement time and the increasing relevance of optical measurement technologies.
Areal Surface Measurement with White-Light Interferometry
This section outlines the benefits of white-light interferometry for non-contact, high-precision surface measurements, including full 3D areal information, excellent resolution, and quick, reliable measurements on various surfaces.
Characterize Form Parameters with a Large Field of View
TopMap systems are described as effective for characterizing large surfaces, measuring parameters like flatness, waviness, and parallelism, with a large vertical measurement range suitable for surfaces with high steps or at the base of drilled holes.
Characterize Microstructures
The document highlights the importance of evaluating microstructures for improving surface functionalities such as lubrication and adhesion, emphasizing the need for high-resolution evaluation of roughness and structural details.
Interview with Prof. Dr.-Ing. Albert Weckenmann
Prof. Weckenmann discusses the shift from tactile to optical measurement methods, noting the benefits of optical methods like fast data acquisition and functionality prediction, while stressing the need for industry adaptation.
Comparing Different Technologies
This section compares various optical methods for surface metrology, emphasizing the importance of selecting the appropriate method based on specific measurement tasks.
Quality Control in Challenging Production Environments
The integration of optical surface measurement instruments in production environments is discussed, highlighting their role in quality control and process optimization.
Conclusion
The document predicts a steady increase in the application of optical surface measurement instruments, particularly in micro and nano technologies, stressing the importance of adapting metrology to Industry 4.0 and AMP 2 standards.
Introduction to Optical Surface Metrology
The Fair Data Sheet Initiative aims to standardize datasheets in optical surface metrology, facilitating the comparison of different instruments and aiding manufacturers in informed purchasing decisions.
3D Measurement on Shock Absorber Pistons
White-light interferometry is presented as a solution for rapid, repeatable 3D data acquisition of complex piston surfaces, overcoming the limitations of traditional tactile measurement systems.
Requirements and Challenges
White-light interferometry is suitable for quality control in manufacturing shock absorber pistons, addressing the limitations of tactile methods in measuring flatness and parallelism.
3D Characterization of Pistons
The technology captures piston surface topography quickly and accurately, allowing for the determination of geometric parameters and enhancing surface characteristic evaluation.
White-light Interferometry in Manufacturing
This method is effective for quality control, focusing on key parameters like height differences and flatness, with automated data acquisition streamlining the process.
Function Driven by Precision
Optical measurement methods ensure precision in manufacturing, particularly in the automotive industry, where compliance with tight tolerances is essential.
High Vertical Precision with a Large Lateral Field-of-View
White-light interferometry offers high vertical resolution independent of the lateral field-of-view, with Polytec's TopMap interferometers designed for production line integration.
Measuring Flatness, Roughness, and Parallelism
TopMap systems are ideal for inspecting surfaces with varying depths, using telecentric optics to avoid shadows and reach recessed areas, ensuring accurate results.
Quality Assurance in Watchmaking
White-light interferometry provides fast, high-resolution measurements for precision micro-parts in watchmaking, crucial for maintaining functionality.
Non-contact Inspection of Coated Surfaces
White-light interferometry is used for non-destructive analysis of coated surfaces, optimizing friction, wear resistance, and corrosion protection.
Introduction
The document discusses the investigation of surface behavior at connection points, focusing on changes in pre-tensioning force and deformations under specific conditions.
Non-contact Surface Metrology
Optical methods like white-light interferometry offer advantages over traditional tactile methods, enabling quick measurements and high reproducibility.
White-light Interferometry
White-light interferometers provide high vertical resolution, suitable for measuring large surfaces with nanometer precision, particularly in production environments.
Comparison of Surface Metrology Techniques
Various optical methods are compared, with white-light interferometry providing high vertical resolution and suitability for large surfaces.
Multi-sensor Applications
Multi-sensor systems offer flexibility by combining different measurement techniques, providing comprehensive surface data.
Conclusion
There is a growing need for detailed surface analysis, with multi-sensor concepts ideal for diverse surface metrology applications.
Introduction to Chromatic Confocal Probing
Chromatic confocal probing is an optical point-based sensor technology used for high lateral resolution applications, allowing for complex shape tracing without vertical scanning.
Measurement Techniques and Comparisons
A combination of white-light interferometry and chromatic confocal technology allows for comprehensive surface characterization, with comparisons showing slight differences in measurement principles.
TopMap Pro.Surf+ Capabilities
The TopMap Pro.Surf+ system offers modular upgrades for roughness measurement, providing a flexible solution for quality control.
Quality Control in Manufacturing
Polytec’s TopMap systems offer rapid, effective solutions for quality assurance, suitable for testing laboratories and near-production environments.
Polytec's Recipe Concept
Polytec developed a "recipe" concept for storing measurement and evaluation parameters, supporting traceability and flexibility in measurement settings.
Standardization and Industry Trends
Optical measuring techniques are increasingly included in international standards, providing more freedom for users but requiring detailed knowledge for application.
Conclusion
Polytec’s TopMap family offers versatile tools for surface metrology, designed to meet modern manufacturing demands with precise and reliable quality inspections.
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Catalog excerpts

TopMap Success stories-1

TopMap Success stories Applications of 3D surface metrology

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TopMap Success stories-2

Content Foreword Areal surface measurement with white-light interferometry Characterize form parameters with a large field of view Interview Prof. Dr.-Ing. Prof. h.c. mult. Dr.-Ing. E.h. Dr. h.c. mult. Albert Weckenmann Interview Prof. Dr.-Ing. Jörg Seewig The smoking gun How fair are specifications in optical surface metrology? 3D measurement on shock absorber pistons Function driven by precision Quality around the clock Non-contact inspection of coated surfaces by white-light interferometry Comparing different technologies Overview of optical methods for surface metrology Form deviation plus...

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TopMap Success stories-3

Surface metrology tailored to your needs TopMap family 38 Comparing different technologies

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TopMap Success stories-4

“ urfaces in the right light.” S Dr. Gnass about market trends and need for optical surface inspections Dear readers, our development team never stands still; market requirements and needs are always changing, with research and production environments constantly evolving. Take for example microsystem applications, with components becoming smaller every day and having tighter tolerances than ever before. The same can be said about topography of precision parts, they become more complex and therefore more problematic to characterize, especially when the measurement needs to be directly integrated...

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TopMap Success stories-5

precision measurement systems that quickly scan the topography of white-light interferometry a workpiece. Well-established white-light interferometry achieves a resolution at the nanometer scale. Why measure with light?Why measure with TopMap white-light interferometers? ■ Non-contact, non-destructive and repeatable surface characterization ■ Full areal information in 3D to capture all surface details ■ On almost any surface ■ Excellent lateral resolution ■ Check manufacturing tolerances in a short time ■ Large field of view even without stitching ■ Objective-free design avoids risk of collision...

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TopMap Success stories-6

Characterize form parameters with a large field of view LARGE AREAL MEASUREMENT HEIGHT & STEPS FORM PARAMETER Measure flatness, waviness and more Regarding functional surfaces, flatness is often decisively important. Examples are parts with sealing surfaces for pressure and vacuum technology, and also transparent foils for displays, semiconductor components, metal and ceramics surfaces. TopMap systems allow an areal measurement of large surfaces up to a volume of 230 x 220 x 70 mm³ and therefor provide a fast, reliable and complete characterization of your workpiece. Analyze multiple surfaces...

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TopMap Success stories-7

Characterize structures with high resolution STRUCTURAL DETAILS FILM THICKNESS Characterize microstructures Evaluate roughness Functional surfaces often require certain structures. For example, it can be important to characterize the type and distribution of pores used to hold lubricant between frictional surfaces in tribology. Besides, microstructres show a key role for improving the adhesion of coatings in the steel industry. Unwanted structures may increase frictional forces or cause disturbing vibrations. Characterization of roughness is a must-do, particularly when wear properties, lubrication...

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TopMap Success stories-8

We talked with Prof. Dr.-Ing. Prof. h.c. mult. Dr.-Ing. E.h. Dr. h.c. mult. Albert Weckenmann, former professor at the University of Erlangen-Nuremberg, Germany, about the limitations of tactile surface measurement technology and the opportunities of non-contact methods. “ ptical surface metrology complements O tactile measurement techniques” Polytec is headquartered in Waldbronn and you were also born in Waldbronn. Can we say that Waldbronn is famous for its experts in metrology? That’s a nice question for an introduction. Well, we are both working on making Waldbronn known as a nucleus for...

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TopMap Success stories-9

keep pace with – the development. Almost all of the people involved in specifying, manufacturing and quality assurance, such as operators, technicians and engineers, must be retrained, and the question arises whether the "old" technical drawings are still valid. So there are some very good reasons why people involved with production measurement technology have very conservative attitudes. Optical methods are therefore being introduced very tentatively into surface measurement technology. The acceptance can be accelerated only moderately through measures that are aimed at conviction and acceptance....

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TopMap Success stories-10

to replace tactile measurement technology. In areas where this technology is established, it will continue to be applied. It makes more sense to use the many fold advantages of the optical data acquisition for new applications and to extend the computerized evaluation in such a way that the degree of the expected functionality can be predicted. There are different optical methods for characterizing surfaces. Each one has its advantages and limitations. The end-user wants to see results, or in other words his or her aim is to characterize the product or process based on the measurement results....

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TopMap Success stories-11

effort can be minimized. There is only a need to measure what will be processed further, required for documentation or necessary in the event that there are complaints or liability claims. Costs can be saved if nothing will be done with the measurement results! Although the level of available information about products in micro- and nanometer dimensions is in reasing (thanks to optical c methods), industry is still trying to solve problems with macro-dimensional methods. You are an expert for GPS (geometrical product specifications) so what can you say about the future of GPS for this new field?...

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TopMap Success stories-12

Polytec had the chance to interview Prof. Dr.-Ing. Jörg Seewig, Chair of Metrology and Sensor Technology at the TU Kaiserslautern, about optical in-process measurement technology in the automobile industry. Professor Seewig, what are the main points of focus for you as Chair of Metrology and Sensor Technology? We are working on the basic principles and applications of optical metrology in manufacturing processes. We are still working out what our focal points will be as we are still in intensive discussions with our expert colleagues, for example from mechanics, manufacturing technology, material...

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