Catalog excerpts


Infrared Microscope —Dedicated AIMsolution Software ------- 02 Infrared Microscope —Using Imaging Analysis ------- 05 EDXIR-Analysis EDX-FTIR Contaminant Finder/Material Inspector ------- 0

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Infrared Microscope —Dedicated AIMsolution Software Spectroscopy Business Unit, Analytical & Measuring Instruments Division Hisato Fukuda AIMsolution software for AIM-9000 infrared microscopes offers many new and improved features and is easier to use than AIMView, Shimadzu's previous microscope software. Several of the more representative features are described below. 1. Introduction As mentioned in the previous volume of FTIR Talk Letter, measurements using an infrared microscope involve the following steps. (1) Pretreat the sample, as necessary. (2) Place the item being measured on the...

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3. Simultaneous Visual Observation and Measurement To enable measurements at the same time as visual observation, the mirror referred to as a "hot mirror" is placed in the optical path. The hot mirror reflects infrared light, but transmits visible It is sometimes desirable to confirm whether or not any signifi- light. The hot mirror separates the light that is transmitted cant peaks will appear from a specified measurement point through and reflected from the sample into visible and infrared before measuring the sample in step (4). The simultaneous visual light. The visible light for...

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Microscope Settings Photograph Image tent Points nent points can Ready Guidance Microscope Setting Optical mode: Reflectance Objective: Wide-field Camera(2 s/ Lighting DetaHs | 5. Guidance Function Guidance features display information for guiding operators through the measurement process from instrument initialization to sample measurement. Clicking the guidance button displays a guidance bar along the left edge. The example in Fig. 7 shows guidance information displayed for registering measurement points. It indicates the upper limit values for registering measurement points and provides...

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Infrared Microscope —Using Imaging Analysis Global Application Development Center, Analytical & Measuring Instruments Division Risa Fuji In May 2016, Shimadzu released the AIM-9000 infrared microscope as an automatic failure analysis system. In FTIR Talk Letter Vol. 27, an article entitled "New Infrared Microscope—Convenience of a Wide-View Camera" described the convenience of using the wide-view camera to view large areas of a sample. This article describes the functionality of the optional mapping program available for the AIM-9000's AIMsolution control software. 1. Introduction Imaging...

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the area inside the white box in Fig. 1 is shown in Fig. 2. Based Given default settings, imaging analytical results display a chemi- on Fig. 1, the contaminant size is determined to be about 600 cal image with areas with higher values in red and areas with lower values in blue, calculated based on either intensity at a In Fig. 2, characteristic features are labeled A, B, and C. Infrared specified position, intensity ratio at a specified position, peak spectra obtained at points A, B, and C are shown in Fig. 3. height, peak height ratio, peak area, peak area ratio, or match Polyethylene...

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3. Example of Electronic Circuit Board Analysis Imaging analysis clearly showed the distribution of components, even in the case of this sample for which the distribution is not visually observable. A tiled image of the electronic circuit board is shown in Fig. 6. Data from the area in the red box was analyzed. Because visual observation was not able to confirm differences with respect to the surrounding area, imaging analysis was performed using the microscope reflection method. An area 200 µm tall by 325 µm wide was measured. Other measurement parameters were the same as in Table 1....

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EDX-FTIR Contaminant Finder/Material Inspector EDXIR-Analysis software is specially designed to perform integrated analysis of data acquired from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content, and from FTIR, which is excellent at the identification and qualification of organic compounds. ■ Contaminant Analysis Performing qualitative analysis using data acquired by both EDX and FTIR enables high-precision automatic identification analysis. This heightens the efficiency of data analysis and provides strong support for contaminant...

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