Galilei
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Technical Features Dual Scheimpflug Imaging GALILEI™ captures slit images from opposite sides of the illuminated slit, and averages the elevation data obtained from corresponding opposite slit images. This Dual Scheimpflug Imaging technique improves the detection of the posterior corneal surface and provides for outstanding accuracy in pachymetry across the entire cornea, even when the camera is Merging of Placido and Scheimpflug data Although the resolution of Scheimpflug images is high enough to deliver accurate profile data, it is insufficient to calculate central corneal power (curvature data) with acceptable accuracy. GALILEI™ overcomes this limitation by merging Placido and Scheimpflug data, acquired simultaneously by the two techniques, into a comprehensive single data set. This is essential for obtaining highest accuracy for both elevation and curvature data across the entire cornea. Near/Far Fixation Target The GALILEI™ Dual Scheimpflug Analyzer features an adjustable near/far fixation target that allows the examination of the anterior chamber, crystalline lens, and any intraocular lenses at different accommodation states. The software interface allows the user to view the acquired Placido or Top View image (center) and simultaneously acquired Scheimpflug images, left (top) and right (bottom). This combined image is used for aligning the optics module in front of the patient's eye. Living human eyes are always in motion. Therefore, the rotational device axis may become decentered from the aligned vertex position during the course of the rotational scan acquisition. In this situation, the projected slits impinge upon the anterior surface at different angles, resulting in two apparent slit images representing a different relative thickness. 1 mm of deviation may generate errors of up to 30 /jm in apparent thickness. Key advantages of Dual Scheimpflug Imaging with integrated Placido * Direct measurement of anterior corneal surface curvature * Direct measurement of elevation of all anterior segment structures * Pachymetry calculation that is insensitive to * Motion correction from top view camera * Greater coverage area in combining both * Same reference axis for both technoloqies. Reduction of Decentration Errors: R & L Averaged ♦ Deviation left ■ Deviatori right Q Averaged Simple averaging (green line) of the thicknesses in the two corresponding Scheimpflug views (red and blue lines) reduces the decentration error by a factor of 10, without the need for correcting the misalignment. Technical Data Ziemer Ophthalmic Systems AG a Ziemer Group Company a Ziemer Group Company Wood River, Illinois, 62095, e 2008 Ziemer Ophthalmic Systems AG. Actual product characteristics, specifications, and prices are subject to change. 410.931.002 I 0702 Product Information * Manufacturer: SIS Surgical Instrument Systems AG, (a Ziemer Group Company) * Sales & Service: Ziemer Ophthalmic Systems AG, CH-2562 Port (Switzerland) and its network of established ophthalmic equipment distributors. Visit * Availability: Europe: CE-marked. USA: FDA 510(k) cleared. For other countries, availability may be restricted due to local regulatory requirements; please contact Ziemer Ophthalmics for details. * Configuration: self-contained system includes: optics module containing dual Scheimpflug camera, top view camera, Placido disk, and auxiliary monitor, mounted on a joystick-controlled cross- slide; computer with 17" LCD color monitor, keyboard & mouse; table on wheels, with motorized height adjustment. * Accessories: optional printer (not supplied; any Windows-compatible printer with USB connection * Service: Maintenance and Repair Service is available from the manufacturer and from local certified Service Centers (please contact your local distributor or consult the Ziemer Group website for address information). * Warranty: Ziemer's GALILEI system comes with a 12-month limited warranty on parts and workmanship. Please consult Ziemer Ophthalmic Systems' Warranty Terms for details. * Caution: Federal (U.S.) law restricts this device to sale by or on the order of a physician. Dual Scheimpflug Analyzer Beyond Topography. Precision mapping of Cornea